Linear diattenuation and retardance measurements in an IR spectropolarimeter

David B. Chenault, Russell A Chipman

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

A technique to measure linear diattenuation and retardance spectra of infrared samples in transmission has been developed. A sample is rotated between two fixed linear polarizers in the sample compartment of an infrared spectrometer. The intensity modulation resulting from the rotation of the sample is Fourier analyzed and the diattenuation and retardation of the sample are calculated from these Fourier series coefficients. For single plate devices, such as waveplates, sheet polarizers, or liquid crystals, whose thickness is known, the birefringence spectrum can also be determined. This technique has been utilized in the sample compartment of a Fourier transform infrared spectropolarimeter to determine the linear diattenuation and retardance spectra from 2.5 to 16.5 microns of an infrared multiple order retarder, two achromatic retarders, and a liquid crystal sample.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsRussel A. Chipman, John W. Morris
PublisherPubl by Int Soc for Optical Engineering
Pages263-278
Number of pages16
Volume1317
ISBN (Print)0819403725
StatePublished - 1990
Externally publishedYes
EventPolarimetry: Radar, Infrared, Visible, Ultraviolet, and X-Ray - Huntsville, AL, USA
Duration: May 15 1990May 17 1990

Other

OtherPolarimetry: Radar, Infrared, Visible, Ultraviolet, and X-Ray
CityHuntsville, AL, USA
Period5/15/905/17/90

Fingerprint

polarimeters
Infrared radiation
Liquid crystals
Infrared spectrometers
Fourier series
retarders
Birefringence
compartments
polarizers
Fourier transforms
Modulation
liquid crystals
infrared spectrometers
birefringence
modulation
coefficients

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Chenault, D. B., & Chipman, R. A. (1990). Linear diattenuation and retardance measurements in an IR spectropolarimeter. In R. A. Chipman, & J. W. Morris (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 1317, pp. 263-278). Publ by Int Soc for Optical Engineering.

Linear diattenuation and retardance measurements in an IR spectropolarimeter. / Chenault, David B.; Chipman, Russell A.

Proceedings of SPIE - The International Society for Optical Engineering. ed. / Russel A. Chipman; John W. Morris. Vol. 1317 Publ by Int Soc for Optical Engineering, 1990. p. 263-278.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Chenault, DB & Chipman, RA 1990, Linear diattenuation and retardance measurements in an IR spectropolarimeter. in RA Chipman & JW Morris (eds), Proceedings of SPIE - The International Society for Optical Engineering. vol. 1317, Publ by Int Soc for Optical Engineering, pp. 263-278, Polarimetry: Radar, Infrared, Visible, Ultraviolet, and X-Ray, Huntsville, AL, USA, 5/15/90.
Chenault DB, Chipman RA. Linear diattenuation and retardance measurements in an IR spectropolarimeter. In Chipman RA, Morris JW, editors, Proceedings of SPIE - The International Society for Optical Engineering. Vol. 1317. Publ by Int Soc for Optical Engineering. 1990. p. 263-278
Chenault, David B. ; Chipman, Russell A. / Linear diattenuation and retardance measurements in an IR spectropolarimeter. Proceedings of SPIE - The International Society for Optical Engineering. editor / Russel A. Chipman ; John W. Morris. Vol. 1317 Publ by Int Soc for Optical Engineering, 1990. pp. 263-278
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