Linewidths in a semiconductor microcavity with variable strength of normal-mode coupling

D. Karaiskaj, T. Maxisch, C. Ellmers, H. J. Kolbe, G. Weiser, R. Rettig, S. Leu, W. Stolz, M. Hofmann, F. Jahnke, S. W. Koch, W. W. Rühle

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

The variation of the normal-mode coupling in a semiconductor microcavity is demonstrated by reducing the cavity quality through stepwise removing top mirror pairs. The dependence of the measured normal-mode coupling linewidths on the cavity quality is well reproduced by calculations on the basis of a linear dispersion theory with broadened excitons in a microcavity.

Original languageEnglish (US)
Pages (from-to)13525-13527
Number of pages3
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume59
Issue number21
DOIs
StatePublished - 1999

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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