Abstract
The variation of the normal-mode coupling in a semiconductor microcavity is demonstrated by reducing the cavity quality through stepwise removing top mirror pairs. The dependence of the measured normal-mode coupling linewidths on the cavity quality is well reproduced by calculations on the basis of a linear dispersion theory with broadened excitons in a microcavity.
Original language | English (US) |
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Pages (from-to) | 13525-13527 |
Number of pages | 3 |
Journal | Physical Review B - Condensed Matter and Materials Physics |
Volume | 59 |
Issue number | 21 |
DOIs | |
State | Published - 1999 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics