The variation of the normal-mode coupling in a semiconductor microcavity is demonstrated by reducing the cavity quality through stepwise removing top mirror pairs. The dependence of the measured normal-mode coupling linewidths on the cavity quality is well reproduced by calculations on the basis of a linear dispersion theory with broadened excitons in a microcavity.
|Original language||English (US)|
|Number of pages||3|
|Journal||Physical Review B - Condensed Matter and Materials Physics|
|State||Published - 1999|
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics