Linewidths in a semiconductor microcavity with variable strength of normal-mode coupling

D. Karaiskaj; T. Maxisch; C. Ellmers; H. J. Kolbe; G. Weiser; R. Rettig; S. Leu; W. Stolz; M. Hofmann; F. Jahnke; S. W. Koch; W. W. Rühle

doi:10.1103/PhysRevB.59.13525

Linewidths in a semiconductor microcavity with variable strength of normal-mode coupling

D. Karaiskaj, T. Maxisch, C. Ellmers, H. J. Kolbe, G. Weiser, R. Rettig, S. Leu, W. Stolz, M. Hofmann, F. Jahnke, S. W. Koch, W. W. Rühle

Optical Sciences, College of

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

The variation of the normal-mode coupling in a semiconductor microcavity is demonstrated by reducing the cavity quality through stepwise removing top mirror pairs. The dependence of the measured normal-mode coupling linewidths on the cavity quality is well reproduced by calculations on the basis of a linear dispersion theory with broadened excitons in a microcavity.

Original language	English (US)
Pages (from-to)	13525-13527
Number of pages	3
Journal	Physical Review B - Condensed Matter and Materials Physics
Volume	59
Issue number	21
DOIs	https://doi.org/10.1103/PhysRevB.59.13525
State	Published - 1999

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

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10.1103/PhysRevB.59.13525

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Karaiskaj, D., Maxisch, T., Ellmers, C., Kolbe, H. J., Weiser, G., Rettig, R., Leu, S., Stolz, W., Hofmann, M., Jahnke, F., Koch, S. W., & Rühle, W. W. (1999). Linewidths in a semiconductor microcavity with variable strength of normal-mode coupling. Physical Review B - Condensed Matter and Materials Physics, 59(21), 13525-13527. https://doi.org/10.1103/PhysRevB.59.13525

Linewidths in a semiconductor microcavity with variable strength of normal-mode coupling. / Karaiskaj, D.; Maxisch, T.; Ellmers, C.; Kolbe, H. J.; Weiser, G.; Rettig, R.; Leu, S.; Stolz, W.; Hofmann, M.; Jahnke, F.; Koch, S. W.; Rühle, W. W.

In: Physical Review B - Condensed Matter and Materials Physics, Vol. 59, No. 21, 1999, p. 13525-13527.

Research output: Contribution to journal › Article › peer-review

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AU - Weiser, G.

AU - Rettig, R.

AU - Leu, S.

AU - Stolz, W.

AU - Hofmann, M.

AU - Jahnke, F.

AU - Koch, S. W.

AU - Rühle, W. W.

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Linewidths in a semiconductor microcavity with variable strength of normal-mode coupling

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