Linewidths in a semiconductor microcavity with variable strength of normal-mode coupling

D. Karaiskaj, T. Maxisch, C. Ellmers, H. J. Kolbe, G. Weiser, R. Rettig, S. Leu, W. Stolz, M. Hofmann, F. Jahnke, S. W. Koch, W. W. Rühle

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