Mach-Zehnder interferometry method for decoupling electro-optic and piezoelectric effects in poled polymer films

Charles Greenlee, Anael Guilmo, Ayodeji Opadeyi, Roland Himmelhuber, Robert A Norwood, Mahmoud Fallahi, Jingdong Luo, Su Huang, Xing Hua Zhou, Alex K Y Jen, Nasser N Peyghambarian

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Abstract

A Mach-Zehnder interferometer (MZI) is utilized to decouple the electro-optic and piezoelectric tensor effects occurring in a poled polymer film. This method has significant advantages over the commonly used Teng-Man reflection ellipsometry technique by allowing for the independent determination of the Pockel's coefficients r13 and r33 and the piezoelectric coefficient d33. The r33 value of a guest host polymer that consists of AJLZ53 amorphous polycarbonate was found to be 122.69 pm/V and 123.03 pm/V using the MZI and reflection ellipsometry method, respectively. The r33 data fits well to the dispersion of the second order susceptibility tensor based on the two-level model approximation.

Original languageEnglish (US)
Article number041109
JournalApplied Physics Letters
Volume97
Issue number4
DOIs
Publication statusPublished - Jul 26 2010

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ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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