Mach-Zehnder interferometry method for decoupling electro-optic and piezoelectric effects in poled polymer films

Charles Greenlee, Anael Guilmo, Ayodeji Opadeyi, Roland Himmelhuber, Robert A. Norwood, Mahmoud Fallahi, Jingdong Luo, Su Huang, Xing Hua Zhou, Alex K.Y. Jen, Nasser Peyghambarian

Research output: Contribution to journalArticle

23 Scopus citations

Abstract

A Mach-Zehnder interferometer (MZI) is utilized to decouple the electro-optic and piezoelectric tensor effects occurring in a poled polymer film. This method has significant advantages over the commonly used Teng-Man reflection ellipsometry technique by allowing for the independent determination of the Pockel's coefficients r13 and r33 and the piezoelectric coefficient d33. The r33 value of a guest host polymer that consists of AJLZ53 amorphous polycarbonate was found to be 122.69 pm/V and 123.03 pm/V using the MZI and reflection ellipsometry method, respectively. The r33 data fits well to the dispersion of the second order susceptibility tensor based on the two-level model approximation.

Original languageEnglish (US)
Article number041109
JournalApplied Physics Letters
Volume97
Issue number4
DOIs
StatePublished - Jul 26 2010

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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