"Magic Radius" Phenomenon in Thin-ridge SOI Ring Resonators: Theory and Preliminary Observations

Thach G. Nguyen, Ravi S. Tummidi, Robert M. Pafchek, Thomas L. Koch, Arnan Mitchell

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The lateral leakage loss mechanism of the TM-like mode in thin-ridge SOI ring resonators is significantly impacted by the ring radius and waveguide width. This behavior is analyzed using rigorous modeling techniques and verified experimentally.

Original languageEnglish (US)
Title of host publicationConference on Lasers and Electro-Optics, CLEO 2010
StatePublished - Dec 1 2010
Externally publishedYes
EventConference on Lasers and Electro-Optics, CLEO 2010 - San Jose, CA, United States
Duration: May 16 2010May 21 2010

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Other

OtherConference on Lasers and Electro-Optics, CLEO 2010
CountryUnited States
CitySan Jose, CA
Period5/16/105/21/10

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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    Nguyen, T. G., Tummidi, R. S., Pafchek, R. M., Koch, T. L., & Mitchell, A. (2010). "Magic Radius" Phenomenon in Thin-ridge SOI Ring Resonators: Theory and Preliminary Observations. In Conference on Lasers and Electro-Optics, CLEO 2010 (Optics InfoBase Conference Papers).