Majority Logic Decoding under Data-Dependent Logic Gate Failures

Srdan Brkic, Predrag Ivaniš, Bane V Vasic

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

A majority logic decoder made of unreliable logic gates, whose failures are transient and data-dependent, is analyzed. Based on a combinatorial representation of fault configurations a closed-form expression for the average bit error rate for a one-step majority logic decoder is derived, for a regular low-density parity-check (LDPC) code ensemble and the proposed failure model. The presented analysis framework is then used to establish bounds on the one-step majority logic decoder performance under the simplified probabilistic gate-output switching model. Based on the expander property of Tanner graphs of LDPC codes, it is proven that a version of the faulty parallel bit-flipping decoder can correct a fixed fraction of channel errors in the presence of data-dependent gate failures. The results are illustrated with numerical examples of finite geometry codes.

Original languageEnglish (US)
Article number8013135
Pages (from-to)6295-6306
Number of pages12
JournalIEEE Transactions on Information Theory
Volume63
Issue number10
DOIs
StatePublished - Oct 1 2017

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Majority logic
Logic gates
Decoding
Bit error rate
mathematics
Geometry
performance

Keywords

  • Data-dependence
  • faulty hardware
  • LDPC codes
  • majority logic decoding
  • probabilistic gate-output switching model

ASJC Scopus subject areas

  • Information Systems
  • Computer Science Applications
  • Library and Information Sciences

Cite this

Majority Logic Decoding under Data-Dependent Logic Gate Failures. / Brkic, Srdan; Ivaniš, Predrag; Vasic, Bane V.

In: IEEE Transactions on Information Theory, Vol. 63, No. 10, 8013135, 01.10.2017, p. 6295-6306.

Research output: Contribution to journalArticle

Brkic, Srdan ; Ivaniš, Predrag ; Vasic, Bane V. / Majority Logic Decoding under Data-Dependent Logic Gate Failures. In: IEEE Transactions on Information Theory. 2017 ; Vol. 63, No. 10. pp. 6295-6306.
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