Matching planar maps

Helmut Alt, Alon Efrat, Günter Rote, Carola Wenk

Research output: Chapter in Book/Report/Conference proceedingConference contribution

35 Citations (Scopus)

Abstract

The subject of this paper are algorithms for measuring the similarity of patterns of line segments in the plane, a standard problem in, e.g. computer vision, geographic information systems, etc. More precisely, we will define feasible distance measures that reflect how close a given pattern H is to some part of a larger pattern G. These distance measures are generalizations of the well known Fréchet distance for curves. We will first give an efficient algorithm for the case that H is a polygonal curve and G is a geometric graph. Then, slightly relaxing the definition of distance measure we will give an algorithm for the general case where both, H and G, are geometric graphs.

Original languageEnglish (US)
Title of host publicationProceedings of the Annual ACM-SIAM Symposium on Discrete Algorithms
EditorsJ Schewel
Pages589-598
Number of pages10
StatePublished - 2003
EventConfiguralble Computing: Technology and Applications - Boston, MA, United States
Duration: Nov 2 1998Nov 3 1998

Other

OtherConfiguralble Computing: Technology and Applications
CountryUnited States
CityBoston, MA
Period11/2/9811/3/98

Fingerprint

Planar Maps
Distance Measure
Geometric Graphs
Curve
Geographic Information Systems
Line segment
Computer Vision
Geographic information systems
Computer vision
Efficient Algorithms

ASJC Scopus subject areas

  • Chemical Health and Safety
  • Software
  • Safety, Risk, Reliability and Quality
  • Discrete Mathematics and Combinatorics

Cite this

Alt, H., Efrat, A., Rote, G., & Wenk, C. (2003). Matching planar maps. In J. Schewel (Ed.), Proceedings of the Annual ACM-SIAM Symposium on Discrete Algorithms (pp. 589-598)

Matching planar maps. / Alt, Helmut; Efrat, Alon; Rote, Günter; Wenk, Carola.

Proceedings of the Annual ACM-SIAM Symposium on Discrete Algorithms. ed. / J Schewel. 2003. p. 589-598.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Alt, H, Efrat, A, Rote, G & Wenk, C 2003, Matching planar maps. in J Schewel (ed.), Proceedings of the Annual ACM-SIAM Symposium on Discrete Algorithms. pp. 589-598, Configuralble Computing: Technology and Applications, Boston, MA, United States, 11/2/98.
Alt H, Efrat A, Rote G, Wenk C. Matching planar maps. In Schewel J, editor, Proceedings of the Annual ACM-SIAM Symposium on Discrete Algorithms. 2003. p. 589-598
Alt, Helmut ; Efrat, Alon ; Rote, Günter ; Wenk, Carola. / Matching planar maps. Proceedings of the Annual ACM-SIAM Symposium on Discrete Algorithms. editor / J Schewel. 2003. pp. 589-598
@inproceedings{a8a5a7d76f504461975df0c13a33c6b1,
title = "Matching planar maps",
abstract = "The subject of this paper are algorithms for measuring the similarity of patterns of line segments in the plane, a standard problem in, e.g. computer vision, geographic information systems, etc. More precisely, we will define feasible distance measures that reflect how close a given pattern H is to some part of a larger pattern G. These distance measures are generalizations of the well known Fr{\'e}chet distance for curves. We will first give an efficient algorithm for the case that H is a polygonal curve and G is a geometric graph. Then, slightly relaxing the definition of distance measure we will give an algorithm for the general case where both, H and G, are geometric graphs.",
author = "Helmut Alt and Alon Efrat and G{\"u}nter Rote and Carola Wenk",
year = "2003",
language = "English (US)",
pages = "589--598",
editor = "J Schewel",
booktitle = "Proceedings of the Annual ACM-SIAM Symposium on Discrete Algorithms",

}

TY - GEN

T1 - Matching planar maps

AU - Alt, Helmut

AU - Efrat, Alon

AU - Rote, Günter

AU - Wenk, Carola

PY - 2003

Y1 - 2003

N2 - The subject of this paper are algorithms for measuring the similarity of patterns of line segments in the plane, a standard problem in, e.g. computer vision, geographic information systems, etc. More precisely, we will define feasible distance measures that reflect how close a given pattern H is to some part of a larger pattern G. These distance measures are generalizations of the well known Fréchet distance for curves. We will first give an efficient algorithm for the case that H is a polygonal curve and G is a geometric graph. Then, slightly relaxing the definition of distance measure we will give an algorithm for the general case where both, H and G, are geometric graphs.

AB - The subject of this paper are algorithms for measuring the similarity of patterns of line segments in the plane, a standard problem in, e.g. computer vision, geographic information systems, etc. More precisely, we will define feasible distance measures that reflect how close a given pattern H is to some part of a larger pattern G. These distance measures are generalizations of the well known Fréchet distance for curves. We will first give an efficient algorithm for the case that H is a polygonal curve and G is a geometric graph. Then, slightly relaxing the definition of distance measure we will give an algorithm for the general case where both, H and G, are geometric graphs.

UR - http://www.scopus.com/inward/record.url?scp=0038416016&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0038416016&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0038416016

SP - 589

EP - 598

BT - Proceedings of the Annual ACM-SIAM Symposium on Discrete Algorithms

A2 - Schewel, J

ER -