Matching planar maps

Helmut Alt, Alon Efrat, Günter Rote, Carola Wenk

Research output: Contribution to conferencePaper

35 Scopus citations

Abstract

The subject of this paper are algorithms for measuring the similarity of patterns of line segments in the plane, a standard problem in, e.g. computer vision, geographic information systems, etc. More precisely, we will define feasible distance measures that reflect how close a given pattern H is to some part of a larger pattern G. These distance measures are generalizations of the well known Fréchet distance for curves. We will first give an efficient algorithm for the case that H is a polygonal curve and G is a geometric graph. Then, slightly relaxing the definition of distance measure we will give an algorithm for the general case where both, H and G, are geometric graphs.

Original languageEnglish (US)
Pages589-598
Number of pages10
StatePublished - Jan 1 2003
EventConfiguralble Computing: Technology and Applications - Boston, MA, United States
Duration: Nov 2 1998Nov 3 1998

Other

OtherConfiguralble Computing: Technology and Applications
CountryUnited States
CityBoston, MA
Period11/2/9811/3/98

ASJC Scopus subject areas

  • Software
  • Mathematics(all)

Fingerprint Dive into the research topics of 'Matching planar maps'. Together they form a unique fingerprint.

  • Cite this

    Alt, H., Efrat, A., Rote, G., & Wenk, C. (2003). Matching planar maps. 589-598. Paper presented at Configuralble Computing: Technology and Applications, Boston, MA, United States.