Matching planar maps

Helmut Alt, Alon Efrat, Günter Rote, Carola Wenk

Research output: Chapter in Book/Report/Conference proceedingConference contribution

35 Scopus citations


The subject of this paper are algorithms for measuring the similarity of patterns of line segments in the plane, a standard problem in, e.g. computer vision, geographic information systems, etc. More precisely, we will define feasible distance measures that reflect how close a given pattern H is to some part of a larger pattern G. These distance measures are generalizations of the well known Fréchet distance for curves. We will first give an efficient algorithm for the case that H is a polygonal curve and G is a geometric graph. Then, slightly relaxing the definition of distance measure we will give an algorithm for the general case where both, H and G, are geometric graphs.

Original languageEnglish (US)
Title of host publicationProceedings of the Annual ACM-SIAM Symposium on Discrete Algorithms
EditorsJ Schewel
Number of pages10
Publication statusPublished - 2003
EventConfiguralble Computing: Technology and Applications - Boston, MA, United States
Duration: Nov 2 1998Nov 3 1998


OtherConfiguralble Computing: Technology and Applications
CountryUnited States
CityBoston, MA


ASJC Scopus subject areas

  • Chemical Health and Safety
  • Software
  • Safety, Risk, Reliability and Quality
  • Discrete Mathematics and Combinatorics

Cite this

Alt, H., Efrat, A., Rote, G., & Wenk, C. (2003). Matching planar maps. In J. Schewel (Ed.), Proceedings of the Annual ACM-SIAM Symposium on Discrete Algorithms (pp. 589-598)