Measurement of atomic diffraction phases induced by material gratings

John D. Perreault, Alexander D Cronin

Research output: Contribution to journalArticle

12 Citations (Scopus)

Abstract

Atom-surface interactions can significantly modify the intensity and phase of atom de Broglie waves diffracted by a silicon nitride grating. This affects the operation of a material grating as a coherent beam splitter. The phase shifts induced by diffraction are measured by comparing the relative phases of several interfering paths in a Mach-Zehnder Na atom interferometer formed by three material gratings. The values of the diffraction phases are consistent with a simple model which includes a van der Waals atom-surface interaction between the Na atoms and the silicon nitride grating bars.

Original languageEnglish (US)
Article number033610
JournalPhysical Review A
Volume73
Issue number3
DOIs
StatePublished - 2006

Fingerprint

gratings
diffraction
atoms
silicon nitrides
surface reactions
beam splitters
phase shift
interferometers

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Physics and Astronomy(all)

Cite this

Measurement of atomic diffraction phases induced by material gratings. / Perreault, John D.; Cronin, Alexander D.

In: Physical Review A, Vol. 73, No. 3, 033610, 2006.

Research output: Contribution to journalArticle

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