Measurement of corner cube polarization

Randall R. Hodgson, Russell A. Chipman

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Scopus citations

Abstract

Corner cube retroreflectors are geometrically simple devices which have fascinating optical properties. Photographs of corner cube retroreflectors using a polarimeter and collimated laser illumination have verified their polarization properties. The Jones calculus and Pauli spin matrix coefficients have been utilized to classify the observed results.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsRussel A. Chipman, John W. Morris
PublisherPubl by Int Soc for Optical Engineering
Pages436-447
Number of pages12
ISBN (Print)0819403725
StatePublished - Dec 1 1990
Externally publishedYes
EventPolarimetry: Radar, Infrared, Visible, Ultraviolet, and X-Ray - Huntsville, AL, USA
Duration: May 15 1990May 17 1990

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume1317
ISSN (Print)0277-786X

Other

OtherPolarimetry: Radar, Infrared, Visible, Ultraviolet, and X-Ray
CityHuntsville, AL, USA
Period5/15/905/17/90

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Hodgson, R. R., & Chipman, R. A. (1990). Measurement of corner cube polarization. In R. A. Chipman, & J. W. Morris (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (pp. 436-447). (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 1317). Publ by Int Soc for Optical Engineering.