We present a novel method of measuring the depth of a mode for a buried ion-exchanged channel waveguide in glass while simultaneously measuring its near-field mode profile. The method is simple to implement and can be used without removing the sample from a standard waveguide characterization system. Experimental results for surface and buried Ag+/Na+ exchanged waveguides are presented. It is demonstrated that the depth of a mode can be determined with an uncertainty of ±0.2 μm.
- Buried waveguides
- Ion-exchanged waveguides
- Mode profiles
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics