Measurement of ion-exchanged waveguide burial depth with a camera

Jesse A. Frantz, James T A Carriere, Raymond K Kostuk

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

We present a novel method of measuring the depth of a mode for a buried ion-exchanged channel waveguide in glass while simultaneously measuring its near-field mode profile. The method is simple to implement and can be used without removing the sample from a standard waveguide characterization system. Experimental results for surface and buried Ag+/Na+ exchanged waveguides are presented. It is demonstrated that the depth of a mode can be determined with an uncertainty of ±0.2 μm.

Original languageEnglish (US)
Pages (from-to)3149-3154
Number of pages6
JournalOptical Engineering
Volume43
Issue number12
DOIs
StatePublished - Dec 2004

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Waveguides
Cameras
cameras
waveguides
Ions
ions
near fields
Glass
glass
profiles
Uncertainty

Keywords

  • Buried waveguides
  • Ion-exchanged waveguides
  • Mode profiles

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Measurement of ion-exchanged waveguide burial depth with a camera. / Frantz, Jesse A.; Carriere, James T A; Kostuk, Raymond K.

In: Optical Engineering, Vol. 43, No. 12, 12.2004, p. 3149-3154.

Research output: Contribution to journalArticle

Frantz, Jesse A. ; Carriere, James T A ; Kostuk, Raymond K. / Measurement of ion-exchanged waveguide burial depth with a camera. In: Optical Engineering. 2004 ; Vol. 43, No. 12. pp. 3149-3154.
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