Measurement of ion-exchanged waveguide burial depth with a camera

Jesse A. Frantz, James T.A. Carriere, Raymond K. Kostuk

Research output: Contribution to journalArticle

1 Scopus citations

Abstract

We present a novel method of measuring the depth of a mode for a buried ion-exchanged channel waveguide in glass while simultaneously measuring its near-field mode profile. The method is simple to implement and can be used without removing the sample from a standard waveguide characterization system. Experimental results for surface and buried Ag+/Na+ exchanged waveguides are presented. It is demonstrated that the depth of a mode can be determined with an uncertainty of ±0.2 μm.

Original languageEnglish (US)
Pages (from-to)3149-3154
Number of pages6
JournalOptical Engineering
Volume43
Issue number12
DOIs
StatePublished - Dec 1 2004

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Keywords

  • Buried waveguides
  • Ion-exchanged waveguides
  • Mode profiles

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Engineering(all)

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