Abstract
A procedure for measuring the complex dielectric permittivity ε̂ of sheet materials, which uses a lumped-element approach for calculating ε̂ is described. Air is used as a standard material to determine the stray capacitance, inductance, and resistance of the sample holder. With a careful determination of these stray parameters, the frequency limit for these measurements can be extended up to 10 GHz. The residual scatter in the data, after the data have been corrected for stray capacitance, resistance, and inductance effects, is typically below 1% for ε′ and is of the order of 0.001 for tan δ. The procedure uses a low-cost sample holder and a conventional network analyser.
| Original language | English (US) |
|---|---|
| Title of host publication | IEE Proceedings: Science, Measurement and Technology |
| Pages | 123-128 |
| Number of pages | 6 |
| Volume | 152 |
| Edition | 3 |
| DOIs | |
| State | Published - May 2005 |
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ASJC Scopus subject areas
- Electrical and Electronic Engineering
Cite this
Measurement of sheet-material electrical properties : Extending lumped-element methods to 10 GHz. / Sternberg, Ben K; Levitskaya, T. M.
IEE Proceedings: Science, Measurement and Technology. Vol. 152 3. ed. 2005. p. 123-128.Research output: Chapter in Book/Report/Conference proceeding › Chapter
}
TY - CHAP
T1 - Measurement of sheet-material electrical properties
T2 - Extending lumped-element methods to 10 GHz
AU - Sternberg, Ben K
AU - Levitskaya, T. M.
PY - 2005/5
Y1 - 2005/5
N2 - A procedure for measuring the complex dielectric permittivity ε̂ of sheet materials, which uses a lumped-element approach for calculating ε̂ is described. Air is used as a standard material to determine the stray capacitance, inductance, and resistance of the sample holder. With a careful determination of these stray parameters, the frequency limit for these measurements can be extended up to 10 GHz. The residual scatter in the data, after the data have been corrected for stray capacitance, resistance, and inductance effects, is typically below 1% for ε′ and is of the order of 0.001 for tan δ. The procedure uses a low-cost sample holder and a conventional network analyser.
AB - A procedure for measuring the complex dielectric permittivity ε̂ of sheet materials, which uses a lumped-element approach for calculating ε̂ is described. Air is used as a standard material to determine the stray capacitance, inductance, and resistance of the sample holder. With a careful determination of these stray parameters, the frequency limit for these measurements can be extended up to 10 GHz. The residual scatter in the data, after the data have been corrected for stray capacitance, resistance, and inductance effects, is typically below 1% for ε′ and is of the order of 0.001 for tan δ. The procedure uses a low-cost sample holder and a conventional network analyser.
UR - http://www.scopus.com/inward/record.url?scp=19944413711&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=19944413711&partnerID=8YFLogxK
U2 - 10.1049/ip-smt:20045007
DO - 10.1049/ip-smt:20045007
M3 - Chapter
AN - SCOPUS:19944413711
VL - 152
SP - 123
EP - 128
BT - IEE Proceedings: Science, Measurement and Technology
ER -