Measurement of the relative optical phase between amorphous and crystalline regions of the phase-change media of optical recording

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Abstract

We describe a method of measuring the relative optical phase on reflection between amorphous and crystalline regions of the phase-change media of optical data storage. With a red He-Ne laser (wavelength, 632.8 nm) the relative phases on two quadrilayer optical disk stacks were measured and found to be ∼40°. The results are in good agreement with the calculated values based on the known layer thicknesses and refractive indices of the stacks. For calibration purposes the height of a known step on an otherwise flat silicon substrate was measured with the same apparatus. The proposed method is fairly simple to set up, can measure both front-surface and through-substrate types of optical disk, and can be used with any laser that has long coherence length.

Original languageEnglish (US)
Pages (from-to)2167-2173
Number of pages7
JournalApplied optics
Volume39
Issue number13
DOIs
StatePublished - May 1 2000

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Engineering (miscellaneous)
  • Electrical and Electronic Engineering

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