Measurement of the thermal coefficients of erasable phase-change media

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A new method was developed for determining the thermal coefficients of erasable phase change films. The method consists of monitoring the reflectivity variations of a PC sample during the writing process. The system uses a 1.7 μs laser pulse at a fixed power level to create a hot spot under the focused beam, while simultaneously observing the reflectivity variations. The amount of reflected light does not increase initially after the laser has been turned on; there is a knee in each curve that corresponds to the onset of noticeable reflectivity change. Two single layer PC samples were measured using this technique: one was a 35 nm-thick sample and the other was 90 mm thick, both coated on identical glass substrate.

Original languageEnglish (US)
Title of host publicationTopical Meeting on Optical Data Storage - Digest of Technical Papers
Editors Anon
PublisherOptical Soc of America
Pages96-97
Number of pages2
Publication statusPublished - 1997
EventProceedings of the 1997 Optical Data Storage Topical Meeting, ODS - Tucson, AZ, USA
Duration: Apr 7 1997Apr 9 1997

Other

OtherProceedings of the 1997 Optical Data Storage Topical Meeting, ODS
CityTucson, AZ, USA
Period4/7/974/9/97

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ASJC Scopus subject areas

  • Engineering(all)

Cite this

Cheng, L., & Mansuripur, M. (1997). Measurement of the thermal coefficients of erasable phase-change media. In Anon (Ed.), Topical Meeting on Optical Data Storage - Digest of Technical Papers (pp. 96-97). Optical Soc of America.