We describe a method to estimate the thermal conductivity of the substrate, the dielectric layer, the phase-change (PC) layer, and the reflective layer of PC optical recording media. The method relies on the amorphous-to-crystalline phase transition that occurs in the PC layer and takes advantage of the difference in the thermal diffusion behavior under different-sized focused spots. All the results obtained here are reliable with better than ±5% accuracy, which is within the margin of our experimental error.
|Original language||English (US)|
|Number of pages||6|
|Publication status||Published - May 10 2000|
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics