Measurement results for time-delayed source interferometers for windows, hemispherical domes, and tangent ogives

William P. Kuhn, Matthew B. Dubin, Robert S. LeCompte, Hector P. Durazo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

A time-delayed source interferometer manipulates the output of a short-coherence length source so that light reflected from the two surfaces of a nominally constant-thickness optical component interfere. The interference pattern is a measure of optical thickness variation and can be phase-shifted. The approach is well suited to optical components that are nominally constant thickness over some portion of the surface. Interferometers suited to the measurement of windows, hemispherical domes and tangent ogives have been built. Data acquisition, calibration tooling and processing methods are described for the stitching of phase data.

Original languageEnglish (US)
Title of host publicationWindow and Dome Technologies and Materials XI
DOIs
StatePublished - Sep 14 2009
EventWindow and Dome Technologies and Materials XI - Orlando, FL, United States
Duration: Apr 15 2009Apr 16 2009

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7302
ISSN (Print)0277-786X

Other

OtherWindow and Dome Technologies and Materials XI
CountryUnited States
CityOrlando, FL
Period4/15/094/16/09

Keywords

  • Dome
  • Ogive
  • Phase-shift
  • Short coherence
  • Stitching
  • Time-delay
  • Transmitted wavefront
  • Window

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Kuhn, W. P., Dubin, M. B., LeCompte, R. S., & Durazo, H. P. (2009). Measurement results for time-delayed source interferometers for windows, hemispherical domes, and tangent ogives. In Window and Dome Technologies and Materials XI [73020R] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7302). https://doi.org/10.1117/12.818386