Measuring degradation rates without irradiance data

Steve Pulver, Daniel Cormode, Alex Cronin, Dirk Jordan, Sarah Kurtz, Ryan Smith

Research output: Chapter in Book/Report/Conference proceedingConference contribution

13 Scopus citations

Abstract

A method to report photovoltaic (PV) system degradation rates without using irradiance data is demonstrated. First, a set of relative degradation rates are determined by comparing daily AC final yields from a group of PV systems relative to the average final yield of all the PV systems. Then, the difference between relative and absolute degradation rates is found using a Bayesian statistical analysis. This approach is verified by comparing to methods that utilize irradiance data. This approach is significant because PV systems are often deployed without irradiance sensors, so the analysis method described here may enable measurements of degradation using data that were previously thought to be unsuitable for degradation studies.

Original languageEnglish (US)
Title of host publicationProgram - 35th IEEE Photovoltaic Specialists Conference, PVSC 2010
Pages1271-1276
Number of pages6
DOIs
StatePublished - 2010
Event35th IEEE Photovoltaic Specialists Conference, PVSC 2010 - Honolulu, HI, United States
Duration: Jun 20 2010Jun 25 2010

Publication series

NameConference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)0160-8371

Other

Other35th IEEE Photovoltaic Specialists Conference, PVSC 2010
CountryUnited States
CityHonolulu, HI
Period6/20/106/25/10

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering

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    Pulver, S., Cormode, D., Cronin, A., Jordan, D., Kurtz, S., & Smith, R. (2010). Measuring degradation rates without irradiance data. In Program - 35th IEEE Photovoltaic Specialists Conference, PVSC 2010 (pp. 1271-1276). [5614208] (Conference Record of the IEEE Photovoltaic Specialists Conference). https://doi.org/10.1109/PVSC.2010.5614208