Measuring degradation rates without irradiance data

Steve Pulver, Daniel Cormode, Alexander D Cronin, Dirk Jordan, Sarah Kurtz, Ryan Smith

Research output: Chapter in Book/Report/Conference proceedingConference contribution

12 Citations (Scopus)

Abstract

A method to report photovoltaic (PV) system degradation rates without using irradiance data is demonstrated. First, a set of relative degradation rates are determined by comparing daily AC final yields from a group of PV systems relative to the average final yield of all the PV systems. Then, the difference between relative and absolute degradation rates is found using a Bayesian statistical analysis. This approach is verified by comparing to methods that utilize irradiance data. This approach is significant because PV systems are often deployed without irradiance sensors, so the analysis method described here may enable measurements of degradation using data that were previously thought to be unsuitable for degradation studies.

Original languageEnglish (US)
Title of host publicationConference Record of the IEEE Photovoltaic Specialists Conference
Pages1271-1276
Number of pages6
DOIs
StatePublished - 2010
Event35th IEEE Photovoltaic Specialists Conference, PVSC 2010 - Honolulu, HI, United States
Duration: Jun 20 2010Jun 25 2010

Other

Other35th IEEE Photovoltaic Specialists Conference, PVSC 2010
CountryUnited States
CityHonolulu, HI
Period6/20/106/25/10

Fingerprint

Degradation
Statistical methods
Sensors

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering

Cite this

Pulver, S., Cormode, D., Cronin, A. D., Jordan, D., Kurtz, S., & Smith, R. (2010). Measuring degradation rates without irradiance data. In Conference Record of the IEEE Photovoltaic Specialists Conference (pp. 1271-1276). [5614208] https://doi.org/10.1109/PVSC.2010.5614208

Measuring degradation rates without irradiance data. / Pulver, Steve; Cormode, Daniel; Cronin, Alexander D; Jordan, Dirk; Kurtz, Sarah; Smith, Ryan.

Conference Record of the IEEE Photovoltaic Specialists Conference. 2010. p. 1271-1276 5614208.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Pulver, S, Cormode, D, Cronin, AD, Jordan, D, Kurtz, S & Smith, R 2010, Measuring degradation rates without irradiance data. in Conference Record of the IEEE Photovoltaic Specialists Conference., 5614208, pp. 1271-1276, 35th IEEE Photovoltaic Specialists Conference, PVSC 2010, Honolulu, HI, United States, 6/20/10. https://doi.org/10.1109/PVSC.2010.5614208
Pulver S, Cormode D, Cronin AD, Jordan D, Kurtz S, Smith R. Measuring degradation rates without irradiance data. In Conference Record of the IEEE Photovoltaic Specialists Conference. 2010. p. 1271-1276. 5614208 https://doi.org/10.1109/PVSC.2010.5614208
Pulver, Steve ; Cormode, Daniel ; Cronin, Alexander D ; Jordan, Dirk ; Kurtz, Sarah ; Smith, Ryan. / Measuring degradation rates without irradiance data. Conference Record of the IEEE Photovoltaic Specialists Conference. 2010. pp. 1271-1276
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