Measuring distribution of the ellipsoid of birefringence through the thickness of optical disk substrates

Hong Fu, Satoshi Sugaya, M. Mansuripur

Research output: Contribution to journalArticlepeer-review

8 Scopus citations

Abstract

We have measured the birefringence of polycarbonate optical disk substrates, using ellipsometry. For a more comprehensive characterization, the probe beam was incident upon substrates in a wide range of polar angles and from different azimuths relative to track direction (∅). Our measurements show that the ellipsoid of birefringence is tilted in the plane of radial (r) and normal (z) directions. The tilt angle varies through thickness, with a maximum value of approximately 10°. For beams passing through the substrate in the ∅-z plane and at large incident angles, this tilt causes significant conversion (up to 100%) between p- and s-polarized components. Distributions of other parameters, such as the values of in-plane and vertical birefringence, are obtained simultaneously in the measurements.

Original languageEnglish (US)
Pages (from-to)5994-5998
Number of pages5
JournalApplied optics
Volume33
Issue number25
DOIs
StatePublished - Sep 1994

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Engineering (miscellaneous)
  • Electrical and Electronic Engineering

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