Measuring the elastic modulus of polymers by nanoindentation with an atomic force microscope

Daniel Hoffman, Ibrahim Miskioglu, Jaroslaw Drelich, Katerina E Aifantis

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

A new method to determine the elastic modulus of a material using the atomic force microscope (AFM) has been proposed by Tang et al. (Nanotechnology 2008, 19, 495713). This method models the cantilever and the sample as two springs in a series. The ratio of the cantilever spring constant (k) to diameter of the tip (2a) is treated in the model as one parameter (a=k/2d). The value of a, along with the cantilever sensitivity, are determined on two reference samples with known mechanical properties and then used to find the elastic modulus of an unknown sample. To determine the reliability and accuracy of this technique it was tested on several polymers. Traditional depth-sensing nanoindentation was preformed for comparison. Using both methods, the elastic modulus of the polymers tested was calculated. The elastic modulus values from the AFM were within ±(5-20)% of the nanoindenter results.

Original languageEnglish (US)
Title of host publicationTMS Annual Meeting
Pages243-251
Number of pages9
Volume1
StatePublished - 2011
Externally publishedYes
EventEPD Congress 2011 - TMS 2011 Annual Meeting and Exhibition - San Diego, CA, United States
Duration: Feb 27 2011Mar 3 2011

Other

OtherEPD Congress 2011 - TMS 2011 Annual Meeting and Exhibition
CountryUnited States
CitySan Diego, CA
Period2/27/113/3/11

Fingerprint

Nanoindentation
nanoindentation
modulus of elasticity
Polymers
Microscopes
Elastic moduli
microscopes
polymers
nanotechnology
Nanotechnology
mechanical properties
Mechanical properties
sensitivity

Keywords

  • Atomic force microscopy
  • Elastic modulus
  • Nanoindentation
  • Polymers

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Mechanics of Materials
  • Metals and Alloys

Cite this

Hoffman, D., Miskioglu, I., Drelich, J., & Aifantis, K. E. (2011). Measuring the elastic modulus of polymers by nanoindentation with an atomic force microscope. In TMS Annual Meeting (Vol. 1, pp. 243-251)

Measuring the elastic modulus of polymers by nanoindentation with an atomic force microscope. / Hoffman, Daniel; Miskioglu, Ibrahim; Drelich, Jaroslaw; Aifantis, Katerina E.

TMS Annual Meeting. Vol. 1 2011. p. 243-251.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Hoffman, D, Miskioglu, I, Drelich, J & Aifantis, KE 2011, Measuring the elastic modulus of polymers by nanoindentation with an atomic force microscope. in TMS Annual Meeting. vol. 1, pp. 243-251, EPD Congress 2011 - TMS 2011 Annual Meeting and Exhibition, San Diego, CA, United States, 2/27/11.
Hoffman D, Miskioglu I, Drelich J, Aifantis KE. Measuring the elastic modulus of polymers by nanoindentation with an atomic force microscope. In TMS Annual Meeting. Vol. 1. 2011. p. 243-251
Hoffman, Daniel ; Miskioglu, Ibrahim ; Drelich, Jaroslaw ; Aifantis, Katerina E. / Measuring the elastic modulus of polymers by nanoindentation with an atomic force microscope. TMS Annual Meeting. Vol. 1 2011. pp. 243-251
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