Mechanics of polarization ray tracing

Research output: Chapter in Book/Report/Conference proceedingConference contribution

13 Scopus citations

Abstract

Polarization ray tracing, which consist of several extensions to geometrical ray tracing, calculates the evolution of polarization states along ray paths and determines the intrinsic polarization properties, such as diattenuation and retardance, associated with ray paths. This paper compares the suitability of the Jones, Mueller, and a three-dimensional polarization ray tracing calculi, examining the issues of local versus global coordinates, amplitude versus phase representations, inclusion of the wavefront aberration function, partially polarized light, measurements of images by polarimeters, and diffraction image formation by low and high numerical aperture beams.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherPubl by Int Soc for Optical Engineering
Pages62-75
Number of pages14
ISBN (Print)0819409197
StatePublished - Dec 1 1992
Externally publishedYes
EventPolarization Analysis and Measurement - San Diego, CA, USA
Duration: Jul 19 1992Jul 21 1992

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume1746
ISSN (Print)0277-786X

Other

OtherPolarization Analysis and Measurement
CitySan Diego, CA, USA
Period7/19/927/21/92

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Chipman, R. A. (1992). Mechanics of polarization ray tracing. In Proceedings of SPIE - The International Society for Optical Engineering (pp. 62-75). (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 1746). Publ by Int Soc for Optical Engineering.