Methodology for a sub-millimeter near-field beam pattern measurement system

Kristina K. Davis, Chris Groppi, Hamdi Mani, Caleb Wheeler, Chris Walker

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Here we present the methodology and initial results for a new near-field antenna radiation measurement system for submillimeter receivers. The system is based on a 4-port vector network analyzer with two synthesized sources. This method improves on similar systems employing this technique with the use of the network analyzer, which reduces the cost and complexity of the system. Furthermore, a single set of test equipment can analyze multiple receivers with different central frequencies; the frequency range of the system is limited by the output range of the network analyzer and/or the power output of the source signal. The amplitude and phase stability of the system in one configuration at 350 GHz was measured and found to be accurate enough to permit near field antenna measurements. The proper characterization of phase drifts across multiple test configurations demonstrates system reliability. These initial results will determine parameters necessary for implementing a near-field radiation pattern measurement of a Schottky diode receiver operating between 340-360 GHz.

Original languageEnglish (US)
Title of host publicationMillimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy VII
EditorsJonas Zmuidzinas, Wayne S. Holland
PublisherSPIE
ISBN (Electronic)9780819496218
DOIs
StatePublished - Jan 1 2014
EventMillimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy VII - Montreal, Canada
Duration: Jun 24 2014Jun 27 2014

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9153
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

OtherMillimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy VII
CountryCanada
CityMontreal
Period6/24/146/27/14

Keywords

  • Near field measurements
  • antenna beam pattern
  • beam pattern measurements
  • sub-millimeter receiver characterization

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Davis, K. K., Groppi, C., Mani, H., Wheeler, C., & Walker, C. (2014). Methodology for a sub-millimeter near-field beam pattern measurement system. In J. Zmuidzinas, & W. S. Holland (Eds.), Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy VII [91533F] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9153). SPIE. https://doi.org/10.1117/12.2056844