Methodology for testing WDM laser arrays

Mario Dagenais, C. C. Lu, Seyed A. Tabatabaei, Dennis Stone, Yung J. Chen, Henryk Temkin, Mahmoud Fallahi, Nasser Peyghambarian

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The coming of age of wavelength-division-multiplexed (WDM) laser arrays is bringing new challenges in the testing of semiconductor lasers. Because of stringent requirements on the laser linewidths and their frequency stability and because of electrical, optical, and thermal crosstalk problems, a new methodology is required for evaluating the performance of WDM laser arrays. This paper describes techniques that will be used to test WDM laser arrays both cw and under pulsed conditions. The laser arrays for these studies will be procured under a new program called `The WDM Alliance' sponsored by BMDO/AFOSR. Preliminary data on monolithic WDM laser arrays are also presented in this paper.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsLouis S. Lome
Pages263-274
Number of pages12
StatePublished - Jan 1 1996
Externally publishedYes
EventWavelength Division Multiplexing Components - San Jose, CA, USA
Duration: Jan 29 1996Jan 31 1996

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume2690

Other

OtherWavelength Division Multiplexing Components
CitySan Jose, CA, USA
Period1/29/961/31/96

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Dagenais, M., Lu, C. C., Tabatabaei, S. A., Stone, D., Chen, Y. J., Temkin, H., Fallahi, M., & Peyghambarian, N. (1996). Methodology for testing WDM laser arrays. In L. S. Lome (Ed.), Proceedings of SPIE - The International Society for Optical Engineering (pp. 263-274). (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 2690).