Microdots as a means of marking and tracking artifacts

Dale O. Butterfield, Pamela B Vandiver

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Scanning electron microscopy with simultaneous energy dispersive x-ray analysis was used to characterize microdots to assess their suitability for the identification and tracking of artifacts. They were found comparable to commercial state-of-the-art microfilm and microfiche which are known to be durable for about 20 years without postprocessing treatment to stabilize them.

Original languageEnglish (US)
Title of host publicationMaterials Research Society Symposium - Proceedings
PublisherMaterials Research Society
Pages181-186
Number of pages6
Volume352
Publication statusPublished - 1995
Externally publishedYes
EventProceedings of the 1994 Conference on Materials Issues in Art and Archaeology IV - Cancun, Mex
Duration: May 16 1994May 21 1994

Other

OtherProceedings of the 1994 Conference on Materials Issues in Art and Archaeology IV
CityCancun, Mex
Period5/16/945/21/94

    Fingerprint

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Cite this

Butterfield, D. O., & Vandiver, P. B. (1995). Microdots as a means of marking and tracking artifacts. In Materials Research Society Symposium - Proceedings (Vol. 352, pp. 181-186). Materials Research Society.