Microdots as a means of marking and tracking artifacts

Dale O. Butterfield, Pamela B Vandiver

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Scanning electron microscopy with simultaneous energy dispersive x-ray analysis was used to characterize microdots to assess their suitability for the identification and tracking of artifacts. They were found comparable to commercial state-of-the-art microfilm and microfiche which are known to be durable for about 20 years without postprocessing treatment to stabilize them.

Original languageEnglish (US)
Title of host publicationMaterials Research Society Symposium - Proceedings
PublisherMaterials Research Society
Pages181-186
Number of pages6
Volume352
StatePublished - 1995
Externally publishedYes
EventProceedings of the 1994 Conference on Materials Issues in Art and Archaeology IV - Cancun, Mex
Duration: May 16 1994May 21 1994

Other

OtherProceedings of the 1994 Conference on Materials Issues in Art and Archaeology IV
CityCancun, Mex
Period5/16/945/21/94

Fingerprint

Microfilm
X rays
Scanning electron microscopy

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Cite this

Butterfield, D. O., & Vandiver, P. B. (1995). Microdots as a means of marking and tracking artifacts. In Materials Research Society Symposium - Proceedings (Vol. 352, pp. 181-186). Materials Research Society.

Microdots as a means of marking and tracking artifacts. / Butterfield, Dale O.; Vandiver, Pamela B.

Materials Research Society Symposium - Proceedings. Vol. 352 Materials Research Society, 1995. p. 181-186.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Butterfield, DO & Vandiver, PB 1995, Microdots as a means of marking and tracking artifacts. in Materials Research Society Symposium - Proceedings. vol. 352, Materials Research Society, pp. 181-186, Proceedings of the 1994 Conference on Materials Issues in Art and Archaeology IV, Cancun, Mex, 5/16/94.
Butterfield DO, Vandiver PB. Microdots as a means of marking and tracking artifacts. In Materials Research Society Symposium - Proceedings. Vol. 352. Materials Research Society. 1995. p. 181-186
Butterfield, Dale O. ; Vandiver, Pamela B. / Microdots as a means of marking and tracking artifacts. Materials Research Society Symposium - Proceedings. Vol. 352 Materials Research Society, 1995. pp. 181-186
@inproceedings{8734d5250dd049668e2b53ed32c8b47d,
title = "Microdots as a means of marking and tracking artifacts",
abstract = "Scanning electron microscopy with simultaneous energy dispersive x-ray analysis was used to characterize microdots to assess their suitability for the identification and tracking of artifacts. They were found comparable to commercial state-of-the-art microfilm and microfiche which are known to be durable for about 20 years without postprocessing treatment to stabilize them.",
author = "Butterfield, {Dale O.} and Vandiver, {Pamela B}",
year = "1995",
language = "English (US)",
volume = "352",
pages = "181--186",
booktitle = "Materials Research Society Symposium - Proceedings",
publisher = "Materials Research Society",

}

TY - GEN

T1 - Microdots as a means of marking and tracking artifacts

AU - Butterfield, Dale O.

AU - Vandiver, Pamela B

PY - 1995

Y1 - 1995

N2 - Scanning electron microscopy with simultaneous energy dispersive x-ray analysis was used to characterize microdots to assess their suitability for the identification and tracking of artifacts. They were found comparable to commercial state-of-the-art microfilm and microfiche which are known to be durable for about 20 years without postprocessing treatment to stabilize them.

AB - Scanning electron microscopy with simultaneous energy dispersive x-ray analysis was used to characterize microdots to assess their suitability for the identification and tracking of artifacts. They were found comparable to commercial state-of-the-art microfilm and microfiche which are known to be durable for about 20 years without postprocessing treatment to stabilize them.

UR - http://www.scopus.com/inward/record.url?scp=0029521722&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0029521722&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0029521722

VL - 352

SP - 181

EP - 186

BT - Materials Research Society Symposium - Proceedings

PB - Materials Research Society

ER -