Microscopy capabilities of the microscopy, electrochemistry, and conductivity analyzer

M. H. Hecht, J. Marshall, W. T. Pike, U. Staufer, D. Blaney, D. Braendlin, S. Gautsch, W. Goetz, H. R. Hidber, H. U. Keller, W. J. Markiewicz, A. Mazer, T. P. Meloy, J. M. Morookian, C. Mogensen, D. Parrat, Peter Smith, H. Sykulska, R. J. Tanner, R. O. Reynolds & 4 others A. Tonin, S. Vijendran, M. Weilert, P. M. Woida

Research output: Contribution to journalArticle

26 Citations (Scopus)

Abstract

The Phoenix microscopy station, designed for the study of Martian dust and soil, consists of a sample delivery system, an optical microscope, and an atomic force microscope. The combination of microscopies facilitates the study of features from the millimeter to nanometer scale. Light-emitting diode illumination allows for full color optical imaging of the samples as well as imaging of ultraviolet-induced visible fluorescence. The atomic force microscope uses an array of silicon tips and can operate in both static and dynamic mode.

Original languageEnglish (US)
Article numberE00A22
JournalJournal of Geophysical Research: Space Physics
Volume114
Issue number3
DOIs
StatePublished - Mar 20 2009

Fingerprint

electrochemistry
Electrochemistry
microscopy
analyzers
Microscopic examination
Microscopes
conductivity
microscopes
Phoenix (AZ)
optical microscopes
silicon
Imaging techniques
soils
delivery
fluorescence
light emitting diodes
stations
dust
illumination
Silicon

ASJC Scopus subject areas

  • Geochemistry and Petrology
  • Geophysics
  • Earth and Planetary Sciences (miscellaneous)
  • Space and Planetary Science

Cite this

Hecht, M. H., Marshall, J., Pike, W. T., Staufer, U., Blaney, D., Braendlin, D., ... Woida, P. M. (2009). Microscopy capabilities of the microscopy, electrochemistry, and conductivity analyzer. Journal of Geophysical Research: Space Physics, 114(3), [E00A22]. https://doi.org/10.1029/2008JE003077

Microscopy capabilities of the microscopy, electrochemistry, and conductivity analyzer. / Hecht, M. H.; Marshall, J.; Pike, W. T.; Staufer, U.; Blaney, D.; Braendlin, D.; Gautsch, S.; Goetz, W.; Hidber, H. R.; Keller, H. U.; Markiewicz, W. J.; Mazer, A.; Meloy, T. P.; Morookian, J. M.; Mogensen, C.; Parrat, D.; Smith, Peter; Sykulska, H.; Tanner, R. J.; Reynolds, R. O.; Tonin, A.; Vijendran, S.; Weilert, M.; Woida, P. M.

In: Journal of Geophysical Research: Space Physics, Vol. 114, No. 3, E00A22, 20.03.2009.

Research output: Contribution to journalArticle

Hecht, MH, Marshall, J, Pike, WT, Staufer, U, Blaney, D, Braendlin, D, Gautsch, S, Goetz, W, Hidber, HR, Keller, HU, Markiewicz, WJ, Mazer, A, Meloy, TP, Morookian, JM, Mogensen, C, Parrat, D, Smith, P, Sykulska, H, Tanner, RJ, Reynolds, RO, Tonin, A, Vijendran, S, Weilert, M & Woida, PM 2009, 'Microscopy capabilities of the microscopy, electrochemistry, and conductivity analyzer', Journal of Geophysical Research: Space Physics, vol. 114, no. 3, E00A22. https://doi.org/10.1029/2008JE003077
Hecht, M. H. ; Marshall, J. ; Pike, W. T. ; Staufer, U. ; Blaney, D. ; Braendlin, D. ; Gautsch, S. ; Goetz, W. ; Hidber, H. R. ; Keller, H. U. ; Markiewicz, W. J. ; Mazer, A. ; Meloy, T. P. ; Morookian, J. M. ; Mogensen, C. ; Parrat, D. ; Smith, Peter ; Sykulska, H. ; Tanner, R. J. ; Reynolds, R. O. ; Tonin, A. ; Vijendran, S. ; Weilert, M. ; Woida, P. M. / Microscopy capabilities of the microscopy, electrochemistry, and conductivity analyzer. In: Journal of Geophysical Research: Space Physics. 2009 ; Vol. 114, No. 3.
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