Abstract
We present a novel model-free iterative data-processing approach that improves surface reconstruction accuracy for deflectometry tests of unknown surfaces. This new processing method iteratively reconstructs the surface, leading to reduced error in the final reconstructed surface. The method was implemented in a deflectometry system, and a freeform surface was tested and compared to interferometric test results. The reconstructed departure from interferometric results was reduced from 15.80 μm RMS with model-based deflectometry down to 5.20 μm RMS with the iterative technique reported here.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 2110-2113 |
| Number of pages | 4 |
| Journal | Optics Letters |
| Volume | 43 |
| Issue number | 9 |
| DOIs | |
| State | Published - May 1 2018 |
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ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics
Cite this
Model-free deflectometry for freeform optics measurement using an iterative reconstruction technique. / Graves, Logan R.; Choi, Heejoo; Zhao, Wenchuan; Oh, Chang Jin; Su, Peng; Su, Tianquan; Kim, Dae Wook.
In: Optics Letters, Vol. 43, No. 9, 01.05.2018, p. 2110-2113.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Model-free deflectometry for freeform optics measurement using an iterative reconstruction technique
AU - Graves, Logan R.
AU - Choi, Heejoo
AU - Zhao, Wenchuan
AU - Oh, Chang Jin
AU - Su, Peng
AU - Su, Tianquan
AU - Kim, Dae Wook
PY - 2018/5/1
Y1 - 2018/5/1
N2 - We present a novel model-free iterative data-processing approach that improves surface reconstruction accuracy for deflectometry tests of unknown surfaces. This new processing method iteratively reconstructs the surface, leading to reduced error in the final reconstructed surface. The method was implemented in a deflectometry system, and a freeform surface was tested and compared to interferometric test results. The reconstructed departure from interferometric results was reduced from 15.80 μm RMS with model-based deflectometry down to 5.20 μm RMS with the iterative technique reported here.
AB - We present a novel model-free iterative data-processing approach that improves surface reconstruction accuracy for deflectometry tests of unknown surfaces. This new processing method iteratively reconstructs the surface, leading to reduced error in the final reconstructed surface. The method was implemented in a deflectometry system, and a freeform surface was tested and compared to interferometric test results. The reconstructed departure from interferometric results was reduced from 15.80 μm RMS with model-based deflectometry down to 5.20 μm RMS with the iterative technique reported here.
UR - http://www.scopus.com/inward/record.url?scp=85046663475&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85046663475&partnerID=8YFLogxK
U2 - 10.1364/OL.43.002110
DO - 10.1364/OL.43.002110
M3 - Article
AN - SCOPUS:85046663475
VL - 43
SP - 2110
EP - 2113
JO - Optics Letters
JF - Optics Letters
SN - 0146-9592
IS - 9
ER -