@article{0326b99d0ffb4cf3b8627741cabbea39,
title = "Model-free deflectometry for freeform optics measurement using an iterative reconstruction technique",
abstract = "We present a novel model-free iterative data-processing approach that improves surface reconstruction accuracy for deflectometry tests of unknown surfaces. This new processing method iteratively reconstructs the surface, leading to reduced error in the final reconstructed surface. The method was implemented in a deflectometry system, and a freeform surface was tested and compared to interferometric test results. The reconstructed departure from interferometric results was reduced from 15.80 μm RMS with model-based deflectometry down to 5.20 μm RMS with the iterative technique reported here.",
author = "Graves, {Logan R.} and Heejoo Choi and Wenchuan Zhao and Oh, {Chang J.I.N.} and Peng Su and Tianquan Su and Kim, {Dae Wook}",
note = "Funding Information: Acknowledgment. This research was made possible in part by the II-VI Foundation Block-Gift Program, the Technology Research Initiative Fund Optics/Imaging Program, the Freeform Optics project supported by the Korea Basic Science Institute, the Friends of Tucson Optics Endowed Scholarships in Optical Sciences, and we thank Optimax Systems for providing the freeform UUT. Publisher Copyright: {\textcopyright} 2018 Optical Society of America. Copyright: Copyright 2018 Elsevier B.V., All rights reserved.",
year = "2018",
month = may,
day = "1",
doi = "10.1364/OL.43.002110",
language = "English (US)",
volume = "43",
pages = "2110--2113",
journal = "Optics Letters",
issn = "0146-9592",
publisher = "The Optical Society",
number = "9",
}