Modeling and experimental investigation of transverse mode dynamics in VECSEL

Alexandre Laurain, Jorg Hader, Jerome V Moloney

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We present a new method to simulate the formation of transverse modes in VECSELs. An expression for the gain as a function of carrier density and temperature is derived from a simulation of the structure reflectivity, while the field propagation in the cavity is computed with the Huygens-Fresnel integral. A rate equation model is employed to calculate the field and gain dynamics over numerous round-trips. The optimal mode size for single mode operation for a given pump shape is calculated and compared to experimental results. The effect of pump geometry, thermal lensing and structure design will be discussed.

Original languageEnglish (US)
Title of host publicationVertical External Cavity Surface Emitting Lasers (VECSELs) IX
EditorsUrsula Keller
PublisherSPIE
ISBN (Electronic)9781510624443
DOIs
StatePublished - Jan 1 2019
EventVertical External Cavity Surface Emitting Lasers (VECSELs) IX 2019 - San Francisco, United States
Duration: Feb 5 2019Feb 6 2019

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume10901
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceVertical External Cavity Surface Emitting Lasers (VECSELs) IX 2019
CountryUnited States
CitySan Francisco
Period2/5/192/6/19

Keywords

  • Dynamics
  • OPSL
  • Semiconductor
  • Transverse modes
  • VECSEL

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Laurain, A., Hader, J., & Moloney, J. V. (2019). Modeling and experimental investigation of transverse mode dynamics in VECSEL. In U. Keller (Ed.), Vertical External Cavity Surface Emitting Lasers (VECSELs) IX [109010C] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 10901). SPIE. https://doi.org/10.1117/12.2510281