Modeling precision and accuracy of a LWIR microgrid array imaging polarimeter

James K. Boger, J. Scott Tyo, Bradley M. Ratliff, Matthew P. Fetrow, Wiley T. Black, Rakesh Kumar

Research output: Contribution to journalConference article

9 Scopus citations

Abstract

Long-wave infrared (LWIR) imaging is a prominent and useful technique for remote sensing applications. Moreover, polarization imaging has been shown to provide additional information about the imaged scene. However, polarization estimation requires that multiple measurements be made of each observed scene point under optically different conditions. This challenging measurement strategy makes the polarization estimates prone to error. The sources of this error differ depending upon the type of measurement scheme used. In this paper, we examine one particular measurement scheme, namely, a simultaneous multiple-measurement imaging polarimeter (SIP) using a microgrid polarizer array. The imager is composed of a microgrid polarizer masking a LWIR HgCdTe focal plane array (operating at 8.3-9.3 μm), and is able to make simultaneous modulated scene measurements. In this paper we present an analytical model that is used to predict the performance of the system in order to help interpret real results. This model is radiometrically accurate and accounts for the temperature of the camera system optics, spatial nonuniformity and drift, optical resolution and other sources of noise. This model is then used in simulation to validate it against laboratory measurements. The precision and accuracy of the SIP instrument is then studied.

Original languageEnglish (US)
Article number58880U
Pages (from-to)1-12
Number of pages12
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume5888
DOIs
StatePublished - Dec 29 2005
EventPolarization Science and Remote Sensing II - San Diego, CA, United States
Duration: Aug 2 2005Aug 4 2005

Keywords

  • Imaging Polarimeter
  • Infrared Polarization
  • Nonuniformity Correction

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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