Modification of BaTiO3 thin films: Adjustment of the effective surface work function

T. Schulmeyer, S. A. Paniagua, P. A. Veneman, S. C. Jones, P. J. Hotchkiss, A. Mudalige, Jeanne E Pemberton, S. R. Marder, Neal R Armstrong

Research output: Contribution to journalArticle

47 Citations (Scopus)

Abstract

Sputter-deposited BaTiO3 thin films have been modified with an alkylphosphonic acid and a partially-fluorinated alkylphosphonic acid in order to model the surface composition of similarly modified BaTiO3 nanoparticles. We present here the surface characterization of these modified films by a combination of X-ray photoelectron spectroscopy (XPS) and UV-photoelectron spectroscopy (UPS). BaTiO3 layers of average thicknesses ca. 2 nm were prepared by radio frequency (rf) magnetron sputter deposition on Ag films, to avoid charging effects during XPS/UPS characterization. Octadecylphosphonic acid (ODPA) and 3,3,4,4,5,5,6,6,7,7,8,8,8- tridecafluorooctyl phosphonic acid (perfluorohexyloctyl phosphonic acid, FHOPA), molecules with quite different molecular dipole moments, were chemisorbed from solution to the BaTiO3 surface. Polarization-modulation infrared reflection-absorption spectroscopy (PM-IRRAS) of the modified BaTiO3 films indicated bidentate bonding of the alkylphosphonic acid to the oxide. Modification of the BaTiO3 surface with the partially-fluorinated alkylphosphonic acid (versus the normal alkylphosphonic acid) significantly changes the BaTiO3 interface dipole as revealed by UPS/XPS measurements, which, in turn, changes the frontier orbital offsets between the oxide and the organic modifier. The Royal Society of Chemistry.

Original languageEnglish (US)
Pages (from-to)4563-4570
Number of pages8
JournalJournal of Materials Chemistry
Volume17
Issue number43
DOIs
StatePublished - 2007

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adjusting
Thin films
acids
Acids
photoelectron spectroscopy
Photoelectron spectroscopy
thin films
Ultraviolet spectroscopy
X ray photoelectron spectroscopy
Oxides
Sputter deposition
Dipole moment
Absorption spectroscopy
Surface structure
polarization modulation
x rays
oxides
infrared reflection
Modulation
Polarization

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Materials Chemistry
  • Materials Science(all)

Cite this

Schulmeyer, T., Paniagua, S. A., Veneman, P. A., Jones, S. C., Hotchkiss, P. J., Mudalige, A., ... Armstrong, N. R. (2007). Modification of BaTiO3 thin films: Adjustment of the effective surface work function. Journal of Materials Chemistry, 17(43), 4563-4570. https://doi.org/10.1039/b706949a

Modification of BaTiO3 thin films : Adjustment of the effective surface work function. / Schulmeyer, T.; Paniagua, S. A.; Veneman, P. A.; Jones, S. C.; Hotchkiss, P. J.; Mudalige, A.; Pemberton, Jeanne E; Marder, S. R.; Armstrong, Neal R.

In: Journal of Materials Chemistry, Vol. 17, No. 43, 2007, p. 4563-4570.

Research output: Contribution to journalArticle

Schulmeyer, T, Paniagua, SA, Veneman, PA, Jones, SC, Hotchkiss, PJ, Mudalige, A, Pemberton, JE, Marder, SR & Armstrong, NR 2007, 'Modification of BaTiO3 thin films: Adjustment of the effective surface work function', Journal of Materials Chemistry, vol. 17, no. 43, pp. 4563-4570. https://doi.org/10.1039/b706949a
Schulmeyer T, Paniagua SA, Veneman PA, Jones SC, Hotchkiss PJ, Mudalige A et al. Modification of BaTiO3 thin films: Adjustment of the effective surface work function. Journal of Materials Chemistry. 2007;17(43):4563-4570. https://doi.org/10.1039/b706949a
Schulmeyer, T. ; Paniagua, S. A. ; Veneman, P. A. ; Jones, S. C. ; Hotchkiss, P. J. ; Mudalige, A. ; Pemberton, Jeanne E ; Marder, S. R. ; Armstrong, Neal R. / Modification of BaTiO3 thin films : Adjustment of the effective surface work function. In: Journal of Materials Chemistry. 2007 ; Vol. 17, No. 43. pp. 4563-4570.
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