Molecular interferometric imaging

Ming Zhao, Xuefeng Wang, David D. Nolte

Research output: Contribution to journalArticle

26 Citations (Scopus)

Abstract

Common-path in-line shearing interferometry, combined with pixel-array imaging, provides a surface metrology that achieves 15 pm surface height resolution. An eighth-wave thermal oxide on silicon generates a reference wave locked in the condition of phase quadrature for phase-to-intensity conversion that makes surface height or index variations directly detectable by an imaging system. The scaling surface mass sensitivity for the surface metrology application is Sscal = 7 fg/mm under 40x magnification with a molecular resolution of approximately 12 IgG molecules within a pixel, limited by the surface roughness of the substrate. When applied to reverse-phase immunoassays in an antibody microarray format under 7x magnification, the current limit of detection is 10 ng/ml for 1 hour incubation, limited by biological and chemical variability. The biosensor is compatible with real-time binding measurements under active flow conditions with a binding dynamic range per well of 103 and a mass sensitivity of 2 pg/mm2.

Original languageEnglish (US)
Pages (from-to)7102-7118
Number of pages17
JournalOptics Express
Volume16
Issue number10
DOIs
StatePublished - May 12 2008
Externally publishedYes

Fingerprint

magnification
metrology
pixels
immunoassay
antibodies
shearing
bioinstrumentation
quadratures
format
dynamic range
surface roughness
interferometry
scaling
oxides
silicon
molecules

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Molecular interferometric imaging. / Zhao, Ming; Wang, Xuefeng; Nolte, David D.

In: Optics Express, Vol. 16, No. 10, 12.05.2008, p. 7102-7118.

Research output: Contribution to journalArticle

Zhao, M, Wang, X & Nolte, DD 2008, 'Molecular interferometric imaging', Optics Express, vol. 16, no. 10, pp. 7102-7118. https://doi.org/10.1364/OE.16.007102
Zhao, Ming ; Wang, Xuefeng ; Nolte, David D. / Molecular interferometric imaging. In: Optics Express. 2008 ; Vol. 16, No. 10. pp. 7102-7118.
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