Molecular water accumulation on silica measured with picometer height resolution

Xuefeng Wang, Ming Zhao, David D. Nolte

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We observed water film accumulation on silica surfaces to 1 picometer resolution using optical land-contrast (LC) interferometry. The land-contrast approach is non-destructive and allows real-time measurement of thickness variation of small molecular films.

Original languageEnglish (US)
Title of host publicationOptics InfoBase Conference Papers
Publication statusPublished - 2010
Externally publishedYes
EventConference on Lasers and Electro-Optics: Applications, CLEO_Apps 2010 - San Jose, CA, United States
Duration: May 16 2010May 21 2010

Other

OtherConference on Lasers and Electro-Optics: Applications, CLEO_Apps 2010
CountryUnited States
CitySan Jose, CA
Period5/16/105/21/10

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ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

Cite this

Wang, X., Zhao, M., & Nolte, D. D. (2010). Molecular water accumulation on silica measured with picometer height resolution. In Optics InfoBase Conference Papers