Mueller matrix algorithms

David B. Chenault, Joseph L. Pezzaniti, Russell A Chipman

Research output: Chapter in Book/Report/Conference proceedingConference contribution

70 Citations (Scopus)

Abstract

A method for the correction of systematic errors generated by large orientational and retardance errors in the polarization optics in the dual rotating retarder polarimeter is presented. Small orientational and retardance errors (<1°) can lead to large errors in the measured Mueller matrix (> 10% in some matrix elements). We incorporate correction terms for large orientation and retardance errors into the dual rotating retarder data reduction algorithm. Using these data reduction algorithms and a calibration step, the associated systematic errors are calculated and removed from the measured Mueller matrix. This procedure is especially useful for spectral and multi-wavelength systems in which the retardance and often the orientation of the retarders are wavelength dependent. The equations, the procedure to calculate the orientations of the polarization elements and the retardances of the retardation elements, and the method to correct for any errors are presented here. The effect of these errors on the calculated Mueller matrix elements and their correction is shown analytically and through experimental data taken on an infrared spectropolarimeter.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherPubl by Int Soc for Optical Engineering
Pages231-246
Number of pages16
Volume1746
ISBN (Print)0819409197
StatePublished - 1992
Externally publishedYes
EventPolarization Analysis and Measurement - San Diego, CA, USA
Duration: Jul 19 1992Jul 21 1992

Other

OtherPolarization Analysis and Measurement
CitySan Diego, CA, USA
Period7/19/927/21/92

Fingerprint

retarders
matrices
Systematic errors
data reduction
polarimeters
systematic errors
Data reduction
Polarization
Wavelength
Polarimeters
polarization
wavelengths
Optics
Calibration
optics
Infrared radiation

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Chenault, D. B., Pezzaniti, J. L., & Chipman, R. A. (1992). Mueller matrix algorithms. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 1746, pp. 231-246). Publ by Int Soc for Optical Engineering.

Mueller matrix algorithms. / Chenault, David B.; Pezzaniti, Joseph L.; Chipman, Russell A.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 1746 Publ by Int Soc for Optical Engineering, 1992. p. 231-246.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Chenault, DB, Pezzaniti, JL & Chipman, RA 1992, Mueller matrix algorithms. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 1746, Publ by Int Soc for Optical Engineering, pp. 231-246, Polarization Analysis and Measurement, San Diego, CA, USA, 7/19/92.
Chenault DB, Pezzaniti JL, Chipman RA. Mueller matrix algorithms. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 1746. Publ by Int Soc for Optical Engineering. 1992. p. 231-246
Chenault, David B. ; Pezzaniti, Joseph L. ; Chipman, Russell A. / Mueller matrix algorithms. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 1746 Publ by Int Soc for Optical Engineering, 1992. pp. 231-246
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