### Abstract

A method for the correction of systematic errors generated by large orientational and retardance errors in the polarization optics in the dual rotating retarder polarimeter is presented. Small orientational and retardance errors (<1°) can lead to large errors in the measured Mueller matrix (> 10% in some matrix elements). We incorporate correction terms for large orientation and retardance errors into the dual rotating retarder data reduction algorithm. Using these data reduction algorithms and a calibration step, the associated systematic errors are calculated and removed from the measured Mueller matrix. This procedure is especially useful for spectral and multi-wavelength systems in which the retardance and often the orientation of the retarders are wavelength dependent. The equations, the procedure to calculate the orientations of the polarization elements and the retardances of the retardation elements, and the method to correct for any errors are presented here. The effect of these errors on the calculated Mueller matrix elements and their correction is shown analytically and through experimental data taken on an infrared spectropolarimeter.

Original language | English (US) |
---|---|

Title of host publication | Proceedings of SPIE - The International Society for Optical Engineering |

Publisher | Publ by Int Soc for Optical Engineering |

Pages | 231-246 |

Number of pages | 16 |

Volume | 1746 |

ISBN (Print) | 0819409197 |

State | Published - 1992 |

Externally published | Yes |

Event | Polarization Analysis and Measurement - San Diego, CA, USA Duration: Jul 19 1992 → Jul 21 1992 |

### Other

Other | Polarization Analysis and Measurement |
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City | San Diego, CA, USA |

Period | 7/19/92 → 7/21/92 |

### Fingerprint

### ASJC Scopus subject areas

- Electrical and Electronic Engineering
- Condensed Matter Physics

### Cite this

*Proceedings of SPIE - The International Society for Optical Engineering*(Vol. 1746, pp. 231-246). Publ by Int Soc for Optical Engineering.

**Mueller matrix algorithms.** / Chenault, David B.; Pezzaniti, Joseph L.; Chipman, Russell A.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

*Proceedings of SPIE - The International Society for Optical Engineering.*vol. 1746, Publ by Int Soc for Optical Engineering, pp. 231-246, Polarization Analysis and Measurement, San Diego, CA, USA, 7/19/92.

}

TY - GEN

T1 - Mueller matrix algorithms

AU - Chenault, David B.

AU - Pezzaniti, Joseph L.

AU - Chipman, Russell A

PY - 1992

Y1 - 1992

N2 - A method for the correction of systematic errors generated by large orientational and retardance errors in the polarization optics in the dual rotating retarder polarimeter is presented. Small orientational and retardance errors (<1°) can lead to large errors in the measured Mueller matrix (> 10% in some matrix elements). We incorporate correction terms for large orientation and retardance errors into the dual rotating retarder data reduction algorithm. Using these data reduction algorithms and a calibration step, the associated systematic errors are calculated and removed from the measured Mueller matrix. This procedure is especially useful for spectral and multi-wavelength systems in which the retardance and often the orientation of the retarders are wavelength dependent. The equations, the procedure to calculate the orientations of the polarization elements and the retardances of the retardation elements, and the method to correct for any errors are presented here. The effect of these errors on the calculated Mueller matrix elements and their correction is shown analytically and through experimental data taken on an infrared spectropolarimeter.

AB - A method for the correction of systematic errors generated by large orientational and retardance errors in the polarization optics in the dual rotating retarder polarimeter is presented. Small orientational and retardance errors (<1°) can lead to large errors in the measured Mueller matrix (> 10% in some matrix elements). We incorporate correction terms for large orientation and retardance errors into the dual rotating retarder data reduction algorithm. Using these data reduction algorithms and a calibration step, the associated systematic errors are calculated and removed from the measured Mueller matrix. This procedure is especially useful for spectral and multi-wavelength systems in which the retardance and often the orientation of the retarders are wavelength dependent. The equations, the procedure to calculate the orientations of the polarization elements and the retardances of the retardation elements, and the method to correct for any errors are presented here. The effect of these errors on the calculated Mueller matrix elements and their correction is shown analytically and through experimental data taken on an infrared spectropolarimeter.

UR - http://www.scopus.com/inward/record.url?scp=0026962422&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0026962422&partnerID=8YFLogxK

M3 - Conference contribution

SN - 0819409197

VL - 1746

SP - 231

EP - 246

BT - Proceedings of SPIE - The International Society for Optical Engineering

PB - Publ by Int Soc for Optical Engineering

ER -