Multi-channel analyzer/detector system for high-speed, high-resolution powder diffraction

D. P. Siddons, Zhijian Yin, Lars R Furenlid, P. Pietraski, Zheng Li, R. Harlow

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Abstract

The advantage of using high-resolution powder diffraction data to resolve ambiguities in powder diffraction analyses is widely understood. The problem with using such an instrument for routine analyses is the length of time needed to acquire a data set. An obvious solution is to introduce some parallelism in the detector/analyzer system. The system described here uses monolithic elastic design principles to construct a simple 16-element crystal analyzer, and it uses silicon multi-detector technology developed at Brookhaven to provide a compact 16-channel pulse-counting detector system. Together these components can decrease the data collection time by at least a factor of 10. Simple replication of components could further increase the efficiency of collection.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherSPIE
Pages120-131
Number of pages12
Volume3448
StatePublished - 1998
Externally publishedYes
EventProceedings of the 1998 Conference on Crystal and Multilayer Optics - San Diego, CA, USA
Duration: Jul 21 1998Jul 22 1998

Other

OtherProceedings of the 1998 Conference on Crystal and Multilayer Optics
CitySan Diego, CA, USA
Period7/21/987/22/98

Fingerprint

analyzers
high speed
Detectors
high resolution
detectors
diffraction
ambiguity
counting
Silicon
Crystals
silicon
pulses
crystals
Powder Diffraction

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Siddons, D. P., Yin, Z., Furenlid, L. R., Pietraski, P., Li, Z., & Harlow, R. (1998). Multi-channel analyzer/detector system for high-speed, high-resolution powder diffraction. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 3448, pp. 120-131). SPIE.

Multi-channel analyzer/detector system for high-speed, high-resolution powder diffraction. / Siddons, D. P.; Yin, Zhijian; Furenlid, Lars R; Pietraski, P.; Li, Zheng; Harlow, R.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3448 SPIE, 1998. p. 120-131.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Siddons, DP, Yin, Z, Furenlid, LR, Pietraski, P, Li, Z & Harlow, R 1998, Multi-channel analyzer/detector system for high-speed, high-resolution powder diffraction. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 3448, SPIE, pp. 120-131, Proceedings of the 1998 Conference on Crystal and Multilayer Optics, San Diego, CA, USA, 7/21/98.
Siddons DP, Yin Z, Furenlid LR, Pietraski P, Li Z, Harlow R. Multi-channel analyzer/detector system for high-speed, high-resolution powder diffraction. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3448. SPIE. 1998. p. 120-131
Siddons, D. P. ; Yin, Zhijian ; Furenlid, Lars R ; Pietraski, P. ; Li, Zheng ; Harlow, R. / Multi-channel analyzer/detector system for high-speed, high-resolution powder diffraction. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3448 SPIE, 1998. pp. 120-131
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