Multi-pinhole SPECT imaging with silicon strip detectors

Todd E. Peterson, Sepideh Shokouhi, Lars R Furenlid, Donald W. Wilson

Research output: Contribution to journalArticle

13 Citations (Scopus)

Abstract

Silicon double-sided strip detectors offer outstanding instrinsic spatial resolution with reasonable detection efficiency for iodine-125 emissions. This spatial resolution allows for multiple-pinhole imaging at low magnification, minimizing the problem of multiplexing. We have conducted imaging studies using a prototype system that utilizes a detector of 300-micrometer thickness and 50-micrometer strip pitch together with a 23-pinhole collimator. These studies include an investigation of the synthetic-collimator imaging approach, which combines multiple-pinhole projections acquired at multiple magnifications to obtain tomographic reconstructions from limited-angle data using the ML-EM algorithm. Sub-millimeter spatial resolution was obtained, demonstrating the basic validity of this approach.

Original languageEnglish (US)
Article number5076105
Pages (from-to)646-652
Number of pages7
JournalIEEE Transactions on Nuclear Science
Volume56
Issue number3
DOIs
StatePublished - Jun 2009

Fingerprint

pinholes
strip
spatial resolution
collimators
Detectors
magnification
Imaging techniques
Silicon
micrometers
detectors
silicon
iodine 125
Iodine
multiplexing
Multiplexing
projection
prototypes

Keywords

  • Biomedical nuclear imaging
  • Microstrip detectors,silicon radiation detectors
  • Small animal imagers
  • SPECTinstrumentation

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Nuclear Energy and Engineering
  • Nuclear and High Energy Physics

Cite this

Multi-pinhole SPECT imaging with silicon strip detectors. / Peterson, Todd E.; Shokouhi, Sepideh; Furenlid, Lars R; Wilson, Donald W.

In: IEEE Transactions on Nuclear Science, Vol. 56, No. 3, 5076105, 06.2009, p. 646-652.

Research output: Contribution to journalArticle

Peterson, Todd E. ; Shokouhi, Sepideh ; Furenlid, Lars R ; Wilson, Donald W. / Multi-pinhole SPECT imaging with silicon strip detectors. In: IEEE Transactions on Nuclear Science. 2009 ; Vol. 56, No. 3. pp. 646-652.
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