Multifrequency continuous wave terahertz spectroscopy for absolute thickness determination

Maik A Scheller, Kai Baaske, Martin Koch

Research output: Contribution to journalArticle

25 Citations (Scopus)

Abstract

We present a tunable multifrequency continuous wave terahertz spectrometer based on two laser diodes, photoconductive antennas, and a coherent detection scheme. The system is employed to determine the absolute thickness of samples utilizing a proposed synthetic difference frequency method to circumvent the 2π uncertainty known from conventional photomixing systems while preserving a high spatial resolution.

Original languageEnglish (US)
Article number151112
JournalApplied Physics Letters
Volume96
Issue number15
DOIs
StatePublished - Apr 12 2010
Externally publishedYes

Fingerprint

preserving
continuous radiation
antennas
spatial resolution
semiconductor lasers
spectrometers
high resolution
spectroscopy

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Multifrequency continuous wave terahertz spectroscopy for absolute thickness determination. / Scheller, Maik A; Baaske, Kai; Koch, Martin.

In: Applied Physics Letters, Vol. 96, No. 15, 151112, 12.04.2010.

Research output: Contribution to journalArticle

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