Multifrequency continuous wave terahertz spectroscopy for absolute thickness determination

Maik Scheller, Kai Baaske, Martin Koch

Research output: Contribution to journalArticle

25 Scopus citations

Abstract

We present a tunable multifrequency continuous wave terahertz spectrometer based on two laser diodes, photoconductive antennas, and a coherent detection scheme. The system is employed to determine the absolute thickness of samples utilizing a proposed synthetic difference frequency method to circumvent the 2π uncertainty known from conventional photomixing systems while preserving a high spatial resolution.

Original languageEnglish (US)
Article number151112
JournalApplied Physics Letters
Volume96
Issue number15
DOIs
StatePublished - Apr 12 2010

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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