Nanometer scale polarimetry studies using a near-field scanning optical microscope

E. B. McDaniel, Stephen C Mcclain, J. W P Hsu

Research output: Contribution to journalArticle

27 Citations (Scopus)

Abstract

We describe a new technique that incorporates polarization modulation into near-field scanning optical microscopy (NSOM) for nanometer scale polarimetry studies. By using this technique, we can quantitatively measure the optical anisotropy of materials with both the high sensitivity of dynamic polarimetry and the high spatial resolution of NSOM. The magnitude and relative orientation of linear birefringence or linear dichroism are obtained simultaneously. To demonstrate the sensitivity and resolution of the microscope, we map out stress-induced birefringence associated with submicrometer defects at the fusion boundaries of SrTiO3 bicrystals. Features as small as 150 nm were imaged with a retardance sensitivity of ∼3 × 10-3 rad.

Original languageEnglish (US)
Pages (from-to)84-92
Number of pages9
JournalApplied Optics
Volume37
Issue number1
StatePublished - 1998
Externally publishedYes

Fingerprint

Near field scanning optical microscopy
Polarimeters
polarimetry
Birefringence
optical microscopes
near fields
Microscopes
Scanning
Optical anisotropy
Bicrystals
scanning
birefringence
sensitivity
Dichroism
microscopy
polarization modulation
Fusion reactions
bicrystals
Modulation
Polarization

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Nanometer scale polarimetry studies using a near-field scanning optical microscope. / McDaniel, E. B.; Mcclain, Stephen C; Hsu, J. W P.

In: Applied Optics, Vol. 37, No. 1, 1998, p. 84-92.

Research output: Contribution to journalArticle

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