Near-angle polarization light scattering measurements of polished surfaces using a mueller matrix imaging scatterometer

Joshua Gordon, Neil Beaudry, Russell A Chipman

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Near-angle polarization light scattering measurements of polished surfaces using a Mueller Matrix Imaging Scatterometer are performed and results presented. Muller Matrix Movies are presented to aid in visualization of the multidimensional Mueller Matrix BRDF space.

Original languageEnglish (US)
Title of host publicationOptics InfoBase Conference Papers
PublisherOptical Society of America
ISBN (Print)1557527970, 9781557527974
StatePublished - 2005
EventFrontiers in Optics, FiO 2005 - Tucson, AZ, United States
Duration: Oct 16 2005Oct 21 2005

Other

OtherFrontiers in Optics, FiO 2005
CountryUnited States
CityTucson, AZ
Period10/16/0510/21/05

Fingerprint

scatterometers
Light scattering
light scattering
Visualization
Polarization
Imaging techniques
polarization
matrices

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

Cite this

Gordon, J., Beaudry, N., & Chipman, R. A. (2005). Near-angle polarization light scattering measurements of polished surfaces using a mueller matrix imaging scatterometer. In Optics InfoBase Conference Papers Optical Society of America.

Near-angle polarization light scattering measurements of polished surfaces using a mueller matrix imaging scatterometer. / Gordon, Joshua; Beaudry, Neil; Chipman, Russell A.

Optics InfoBase Conference Papers. Optical Society of America, 2005.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Gordon, J, Beaudry, N & Chipman, RA 2005, Near-angle polarization light scattering measurements of polished surfaces using a mueller matrix imaging scatterometer. in Optics InfoBase Conference Papers. Optical Society of America, Frontiers in Optics, FiO 2005, Tucson, AZ, United States, 10/16/05.
Gordon J, Beaudry N, Chipman RA. Near-angle polarization light scattering measurements of polished surfaces using a mueller matrix imaging scatterometer. In Optics InfoBase Conference Papers. Optical Society of America. 2005
Gordon, Joshua ; Beaudry, Neil ; Chipman, Russell A. / Near-angle polarization light scattering measurements of polished surfaces using a mueller matrix imaging scatterometer. Optics InfoBase Conference Papers. Optical Society of America, 2005.
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