Near-angle polarization light scattering measurements of polished surfaces using a mueller matrix imaging scatterometer

Joshua Gordon, Neil Beaudry, Russell Chipman

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Near-angle polarization light scattering measurements of polished surfaces using a Mueller Matrix Imaging Scatterometer are performed and results presented. Muller Matrix Movies are presented to aid in visualization of the multidimensional Mueller Matrix BRDF space.

Original languageEnglish (US)
Title of host publicationFrontiers in Optics, FiO 2005
PublisherOptical Society of America (OSA)
ISBN (Print)1557527970, 9781557527974
DOIs
StatePublished - 2005
EventFrontiers in Optics, FiO 2005 - Tucson, AZ, United States
Duration: Oct 16 2005Oct 21 2005

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Other

OtherFrontiers in Optics, FiO 2005
CountryUnited States
CityTucson, AZ
Period10/16/0510/21/05

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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  • Cite this

    Gordon, J., Beaudry, N., & Chipman, R. (2005). Near-angle polarization light scattering measurements of polished surfaces using a mueller matrix imaging scatterometer. In Frontiers in Optics, FiO 2005 (Optics InfoBase Conference Papers). Optical Society of America (OSA). https://doi.org/10.1364/fio.2005.ftuz4