New classes of reconstruction methods in reflection mode diffraction tomography

Mark A. Anastasio, Matthew A Kupinski, Xiaochuan Pan

Research output: Chapter in Book/Report/Conference proceedingChapter

Abstract

Reflection mode diffraction tomography (DT) is an inversion scheme used to reconstruct the spatially variant refractive index distribution of a scattering object. We propose a linear strategy that makes use of the statistically complementary information inherent in the reflected scattered data to achieve a bias-free reduction of the image variance in two dimensional (2D) reflection mode DT. We derive infinite classes of estimation methods that can estimate the 2D Radon transform of the (band-pass filtered) scattering object function from the reflected scattered data. When the insonifying source is broadband we demonstrate that incorporation of the statistically complementary information generated by each frequency in the incident spectrum can further reduce the variance of the images reconstructed using different estimation methods.

Original languageEnglish (US)
Title of host publicationProceedings of the IEEE Ultrasonics Symposium
PublisherIEEE
Pages839-842
Number of pages4
Volume1
StatePublished - 1998
Externally publishedYes
EventProceedings of the 1998 International Ultrasonics Symposium - Sendai, Miyagi, Jpn
Duration: Oct 5 1998Oct 8 1998

Other

OtherProceedings of the 1998 International Ultrasonics Symposium
CitySendai, Miyagi, Jpn
Period10/5/9810/8/98

Fingerprint

Tomography
Diffraction
Scattering
Radon
Refractive index

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Anastasio, M. A., Kupinski, M. A., & Pan, X. (1998). New classes of reconstruction methods in reflection mode diffraction tomography. In Proceedings of the IEEE Ultrasonics Symposium (Vol. 1, pp. 839-842). IEEE.

New classes of reconstruction methods in reflection mode diffraction tomography. / Anastasio, Mark A.; Kupinski, Matthew A; Pan, Xiaochuan.

Proceedings of the IEEE Ultrasonics Symposium. Vol. 1 IEEE, 1998. p. 839-842.

Research output: Chapter in Book/Report/Conference proceedingChapter

Anastasio, MA, Kupinski, MA & Pan, X 1998, New classes of reconstruction methods in reflection mode diffraction tomography. in Proceedings of the IEEE Ultrasonics Symposium. vol. 1, IEEE, pp. 839-842, Proceedings of the 1998 International Ultrasonics Symposium, Sendai, Miyagi, Jpn, 10/5/98.
Anastasio MA, Kupinski MA, Pan X. New classes of reconstruction methods in reflection mode diffraction tomography. In Proceedings of the IEEE Ultrasonics Symposium. Vol. 1. IEEE. 1998. p. 839-842
Anastasio, Mark A. ; Kupinski, Matthew A ; Pan, Xiaochuan. / New classes of reconstruction methods in reflection mode diffraction tomography. Proceedings of the IEEE Ultrasonics Symposium. Vol. 1 IEEE, 1998. pp. 839-842
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