New planar waveguide attenuated total reflectance techniques for organic thin film spectroscopy and chemical sensing

D. R. Dunphy, Sergio B. Mendes, L. Li, J. J. Burke, J. E. Lee, Neal R Armstrong, Steven S Saavedra

Research output: Chapter in Book/Report/Conference proceedingChapter

1 Citation (Scopus)

Abstract

The planar integrated optical waveguide (IOW) is an inherently sensitive geometry for attenuated total reflection (ATR) spectroscopy of interfacial samples. A major disadvantage that has limited its wider use is the difficulty of measuring broadband spectra. Due to the quantized nature of light propagation in a planar IOW, conventional grating and prism couplers are efficient only over a narrow (<5 nm) spectral range at a given launch angle. We have developed a multichannel spectrometer capable of measuring a broadband visible ATR spectrum at the surface of a single mode, planar waveguide. The bandwidth is greater than 150 nm, which makes it possible to measure spectra of very weakly absorbing molecular films. We have also developed an electrochemically-active, planar IOW (EA-IOW) that combines the information content of spectroelectrochemistry with the sensitivity of the single mode planar waveguide geometry. An evaluation of this device has demonstrated that highly sensitive spectroelectrochemistry of surface confined films can be performed; the estimated pathlength enhancement is ca. 4,000 relative to a transmission geometry.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherSociety of Photo-Optical Instrumentation Engineers
Pages140-148
Number of pages9
Volume3602
ISBN (Print)0819430722
StatePublished - 1999
EventProceedings of the 1999 Advances in Fluorescence Sensing Technology - San Jose, CA, USA
Duration: Jan 24 1999Jan 27 1999

Other

OtherProceedings of the 1999 Advances in Fluorescence Sensing Technology
CitySan Jose, CA, USA
Period1/24/991/27/99

Fingerprint

Planar waveguides
Optical waveguides
optical waveguides
Spectroelectrochemistry
Spectroscopy
waveguides
reflectance
Thin films
Geometry
thin films
geometry
spectroscopy
broadband
Light propagation
Prisms
couplers
prisms
Spectrometers
gratings
spectrometers

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Dunphy, D. R., Mendes, S. B., Li, L., Burke, J. J., Lee, J. E., Armstrong, N. R., & Saavedra, S. S. (1999). New planar waveguide attenuated total reflectance techniques for organic thin film spectroscopy and chemical sensing. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 3602, pp. 140-148). Society of Photo-Optical Instrumentation Engineers.

New planar waveguide attenuated total reflectance techniques for organic thin film spectroscopy and chemical sensing. / Dunphy, D. R.; Mendes, Sergio B.; Li, L.; Burke, J. J.; Lee, J. E.; Armstrong, Neal R; Saavedra, Steven S.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3602 Society of Photo-Optical Instrumentation Engineers, 1999. p. 140-148.

Research output: Chapter in Book/Report/Conference proceedingChapter

Dunphy, DR, Mendes, SB, Li, L, Burke, JJ, Lee, JE, Armstrong, NR & Saavedra, SS 1999, New planar waveguide attenuated total reflectance techniques for organic thin film spectroscopy and chemical sensing. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 3602, Society of Photo-Optical Instrumentation Engineers, pp. 140-148, Proceedings of the 1999 Advances in Fluorescence Sensing Technology, San Jose, CA, USA, 1/24/99.
Dunphy DR, Mendes SB, Li L, Burke JJ, Lee JE, Armstrong NR et al. New planar waveguide attenuated total reflectance techniques for organic thin film spectroscopy and chemical sensing. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3602. Society of Photo-Optical Instrumentation Engineers. 1999. p. 140-148
Dunphy, D. R. ; Mendes, Sergio B. ; Li, L. ; Burke, J. J. ; Lee, J. E. ; Armstrong, Neal R ; Saavedra, Steven S. / New planar waveguide attenuated total reflectance techniques for organic thin film spectroscopy and chemical sensing. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3602 Society of Photo-Optical Instrumentation Engineers, 1999. pp. 140-148
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