New results with silicon pad detectors and low-noise electronics for absorption spectrometry

A. Pullia, H. W. Kraner, Lars R Furenlid

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

High-resistivity silicon diode detectors integrable in array structures have been tested for high-resolution X-ray spectroscopy at various temperatures. Using an inexpensive commercially available front-end transistor we have obtained resolutions of 19 electrons rms, or 165 eV FWHM, at -35°C and 39 electrons rms, or 320 eV FWHM, at 26°C, with 3 and 1 μs shaping times. The obtained resolution values are adequate for synchrotron light based EXAFS experiments. These reliable detectors can be suitably employed for high-performance multichannel systems in which high-rate capability is achieved by using an array of detectors operated in parallel. A 16-element detector prototype has been recently assembled, installed and successfully operated for a real EXAFS experiment at NSLS.

Original languageEnglish (US)
Pages (from-to)452-456
Number of pages5
JournalNuclear Inst. and Methods in Physics Research, A
Volume395
Issue number3
DOIs
StatePublished - Aug 21 1997
Externally publishedYes

Fingerprint

low noise
Spectrometry
Electronic equipment
Detectors
Silicon
detectors
silicon
Full width at half maximum
electronics
spectroscopy
Electrons
X ray spectroscopy
Synchrotrons
Transistors
synchrotrons
Diodes
electrons
transistors
Experiments
diodes

ASJC Scopus subject areas

  • Instrumentation
  • Nuclear and High Energy Physics

Cite this

New results with silicon pad detectors and low-noise electronics for absorption spectrometry. / Pullia, A.; Kraner, H. W.; Furenlid, Lars R.

In: Nuclear Inst. and Methods in Physics Research, A, Vol. 395, No. 3, 21.08.1997, p. 452-456.

Research output: Contribution to journalArticle

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