NIRCam coronagraphic Lyot stop: Design, fabrication and testing

Yalan Mao, Torben B. Andersen, Tracy Kubo, Miguel Virgen, Henry Chan, Greg Feller, Lynn W. Huff, Eric Smith, Gopal Vasudevan, Steve Somerstein, Tom Jamieson, Scott Horner, John Krist, Charles A. Beichman, Carmen Barone, Ron Schmidt, Donna Levin, Steve Seymour, Douglas Kelly, Marcia J Rieke

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

The NIRCam instrument on the James Webb Space Telescope (JWST) will provide a coronagraphic imaging capability to search for extrasolar planets in the 2 - 5 microns wavelength range. This capability is realized by a set of Lyot pupil stops with patterns matching the occulting mask located in the JWST intermediate focal plane in the NIRCam optical system. The complex patterns with transparent apertures are made by photolithographic process using a metal coating in the opaque region. The optical density needs to be high for the opaque region, and transmission needs to be high at the aperture. In addition, the Lyot stop needs to operate under cryogenic conditions. We will report on the Lyot stop design, fabrication and testing in this paper.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Volume8150
DOIs
Publication statusPublished - 2011
EventCryogenic Optical Systems and Instruments XIII - San Diego, CA, United States
Duration: Aug 24 2011Aug 25 2011

Other

OtherCryogenic Optical Systems and Instruments XIII
CountryUnited States
CitySan Diego, CA
Period8/24/118/25/11

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Keywords

  • Coronagraphic imaging
  • JWST
  • Lyot stop
  • NIRCam

ASJC Scopus subject areas

  • Applied Mathematics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Mao, Y., Andersen, T. B., Kubo, T., Virgen, M., Chan, H., Feller, G., ... Rieke, M. J. (2011). NIRCam coronagraphic Lyot stop: Design, fabrication and testing. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 8150). [81500E] https://doi.org/10.1117/12.896451