Non-intrusive dynamic application profiler for detailed loop execution characterization

Ajay Nair, Roman Lysecky

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Scopus citations

Abstract

Application profiling - the process of monitoring an application to determine the frequency of execution within specific regions - is an essential step within the design process for many software and hardware systems. In this paper, we present an efficient innovative, non-intrusive dynamic application profiler (DAProf) capable of profiling an executing application by monitoring the application's short backwards branches and providing detailed profiling statistics for characterizing loop execution behavior. DAProf is ideally suited for hard-ware/software partitioning approaches in which detailed loop execution information is needed to provide accurate performance estimates. DAProf provides a profiling accuracy of greater than 90% with only an 11% area overhead compared to a small ARM9.

Original languageEnglish (US)
Title of host publicationEmbedded Systems Week 2008 - Proceedings of the 2008 International Conference on Compilers, Architecture and Synthesis for Embedded Systems, CASES'08
Pages23-30
Number of pages8
DOIs
StatePublished - Dec 1 2008
EventEmbedded Systems Week 2008 - 2008 International Conference on Compilers, Architecture and Synthesis for Embedded Systems, CASES'08 - Atlanta, GA, United States
Duration: Oct 19 2008Oct 24 2008

Publication series

NameEmbedded Systems Week 2008 - Proceedings of the 2008 International Conference on Compilers, Architecture and Synthesis for Embedded Systems, CASES'08

Other

OtherEmbedded Systems Week 2008 - 2008 International Conference on Compilers, Architecture and Synthesis for Embedded Systems, CASES'08
CountryUnited States
CityAtlanta, GA
Period10/19/0810/24/08

Keywords

  • Dynamic optimization
  • Embedded systems
  • Nonintrusive
  • Profiling

ASJC Scopus subject areas

  • Hardware and Architecture
  • Software
  • Control and Systems Engineering

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  • Cite this

    Nair, A., & Lysecky, R. (2008). Non-intrusive dynamic application profiler for detailed loop execution characterization. In Embedded Systems Week 2008 - Proceedings of the 2008 International Conference on Compilers, Architecture and Synthesis for Embedded Systems, CASES'08 (pp. 23-30). (Embedded Systems Week 2008 - Proceedings of the 2008 International Conference on Compilers, Architecture and Synthesis for Embedded Systems, CASES'08). https://doi.org/10.1145/1450095.1450102