Abstract
We measure the normal-mode linewidths in a semiconductor microcavity with various exciton-photon interaction strengths. Variation of the normal mode coupling and thus of the exciton-photon interaction is obtained reducing the cavity quality by stepwise removing of top mirror pairs. Excellent agreement of the measured linewidths with results of a linear dispersion theory is obtained.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 179-181 |
| Number of pages | 3 |
| Journal | Physica Status Solidi (A) Applied Research |
| Volume | 178 |
| Issue number | 1 |
| DOIs | |
| State | Published - Mar 1 2000 |
| Event | Optics of Excitons in Confined Systems (OECS-6) - Ascona, Switz Duration: Aug 30 1999 → Sep 2 1999 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
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Hofmann, M., Karaiskaj, D., Ellmers, C., Maxisch, T., Jahnke, F., Kolbe, H. J., Weiser, G., Rettig, R., Leu, S., Stolz, W., Koch, S. W., & Rühle, W. W. (2000). Normal-mode linewidths in a semiconductor microcavity with various cavity qualities. Physica Status Solidi (A) Applied Research, 178(1), 179-181. https://doi.org/10.1002/1521-396X(200003)178:1<179::AID-PSSA179>3.0.CO;2-6