Normal-mode linewidths in a semiconductor microcavity with various cavity qualities

M. Hofmann, D. Karaiskaj, C. Ellmers, T. Maxisch, F. Jahnke, H. J. Kolbe, G. Weiser, R. Rettig, S. Leu, W. Stolz, S. W. Koch, W. W. Rühle

Research output: Contribution to journalConference article

Abstract

We measure the normal-mode linewidths in a semiconductor microcavity with various exciton-photon interaction strengths. Variation of the normal mode coupling and thus of the exciton-photon interaction is obtained reducing the cavity quality by stepwise removing of top mirror pairs. Excellent agreement of the measured linewidths with results of a linear dispersion theory is obtained.

Original languageEnglish (US)
Pages (from-to)179-181
Number of pages3
JournalPhysica Status Solidi (A) Applied Research
Volume178
Issue number1
DOIs
StatePublished - Mar 1 2000
EventOptics of Excitons in Confined Systems (OECS-6) - Ascona, Switz
Duration: Aug 30 1999Sep 2 1999

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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    Hofmann, M., Karaiskaj, D., Ellmers, C., Maxisch, T., Jahnke, F., Kolbe, H. J., Weiser, G., Rettig, R., Leu, S., Stolz, W., Koch, S. W., & Rühle, W. W. (2000). Normal-mode linewidths in a semiconductor microcavity with various cavity qualities. Physica Status Solidi (A) Applied Research, 178(1), 179-181. https://doi.org/10.1002/1521-396X(200003)178:1<179::AID-PSSA179>3.0.CO;2-6