Normal-mode linewidths in a semiconductor microcavity with various cavity qualities

M. Hofmann; D. Karaiskaj; C. Ellmers; T. Maxisch; F. Jahnke; H. J. Kolbe; G. Weiser; R. Rettig; S. Leu; W. Stolz; S. W. Koch; W. W. Rühle

doi:10.1002/1521-396X(200003)178:1<179::AID-PSSA179>3.0.CO;2-6

Normal-mode linewidths in a semiconductor microcavity with various cavity qualities

M. Hofmann, D. Karaiskaj, C. Ellmers, T. Maxisch, F. Jahnke, H. J. Kolbe, G. Weiser, R. Rettig, S. Leu, W. Stolz, S. W. Koch, W. W. Rühle

Optical Sciences, College of

Research output: Contribution to journal › Conference article › peer-review

Abstract

We measure the normal-mode linewidths in a semiconductor microcavity with various exciton-photon interaction strengths. Variation of the normal mode coupling and thus of the exciton-photon interaction is obtained reducing the cavity quality by stepwise removing of top mirror pairs. Excellent agreement of the measured linewidths with results of a linear dispersion theory is obtained.

Original language	English (US)
Pages (from-to)	179-181
Number of pages	3
Journal	Physica Status Solidi (A) Applied Research
Volume	178
Issue number	1
DOIs	https://doi.org/10.1002/1521-396X(200003)178:1<179::AID-PSSA179>3.0.CO;2-6
State	Published - Mar 1 2000
Event	Optics of Excitons in Confined Systems (OECS-6) - Ascona, Switz Duration: Aug 30 1999 → Sep 2 1999

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

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10.1002/1521-396X(200003)178:1<179::AID-PSSA179>3.0.CO;2-6

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Hofmann, M., Karaiskaj, D., Ellmers, C., Maxisch, T., Jahnke, F., Kolbe, H. J., Weiser, G., Rettig, R., Leu, S., Stolz, W., Koch, S. W., & Rühle, W. W. (2000). Normal-mode linewidths in a semiconductor microcavity with various cavity qualities. Physica Status Solidi (A) Applied Research, 178(1), 179-181. https://doi.org/10.1002/1521-396X(200003)178:1<179::AID-PSSA179>3.0.CO;2-6

Normal-mode linewidths in a semiconductor microcavity with various cavity qualities. / Hofmann, M.; Karaiskaj, D.; Ellmers, C.; Maxisch, T.; Jahnke, F.; Kolbe, H. J.; Weiser, G.; Rettig, R.; Leu, S.; Stolz, W.; Koch, S. W.; Rühle, W. W.

In: Physica Status Solidi (A) Applied Research, Vol. 178, No. 1, 01.03.2000, p. 179-181.

Research output: Contribution to journal › Conference article › peer-review

Hofmann, M, Karaiskaj, D, Ellmers, C, Maxisch, T, Jahnke, F, Kolbe, HJ, Weiser, G, Rettig, R, Leu, S, Stolz, W, Koch, SW & Rühle, WW 2000, 'Normal-mode linewidths in a semiconductor microcavity with various cavity qualities', Physica Status Solidi (A) Applied Research, vol. 178, no. 1, pp. 179-181. https://doi.org/10.1002/1521-396X(200003)178:1<179::AID-PSSA179>3.0.CO;2-6

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AU - Karaiskaj, D.

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AU - Maxisch, T.

AU - Jahnke, F.

AU - Kolbe, H. J.

AU - Weiser, G.

AU - Rettig, R.

AU - Leu, S.

AU - Stolz, W.

AU - Koch, S. W.

AU - Rühle, W. W.

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AB - We measure the normal-mode linewidths in a semiconductor microcavity with various exciton-photon interaction strengths. Variation of the normal mode coupling and thus of the exciton-photon interaction is obtained reducing the cavity quality by stepwise removing of top mirror pairs. Excellent agreement of the measured linewidths with results of a linear dispersion theory is obtained.

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Normal-mode linewidths in a semiconductor microcavity with various cavity qualities

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