Abstract
We measure the normal-mode linewidths in a semiconductor microcavity with various exciton-photon interaction strengths. Variation of the normal mode coupling and thus of the exciton-photon interaction is obtained reducing the cavity quality by stepwise removing of top mirror pairs. Excellent agreement of the measured linewidths with results of a linear dispersion theory is obtained.
Original language | English (US) |
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Pages (from-to) | 179-181 |
Number of pages | 3 |
Journal | Physica Status Solidi (A) Applied Research |
Volume | 178 |
Issue number | 1 |
DOIs | |
State | Published - Mar 1 2000 |
Event | Optics of Excitons in Confined Systems (OECS-6) - Ascona, Switz Duration: Aug 30 1999 → Sep 2 1999 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics