Normal-mode linewidths in a semiconductor microcavity with various cavity qualities

M. Hofmann, D. Karaiskaj, C. Ellmers, T. Maxisch, F. Jahnke, H. J. Kolbe, G. Weiser, R. Rettig, S. Leu, W. Stolz, S. W. Koch, W. W. Rühle

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