Novel method for measuring the vertical birefringence of optical disk substrates

Masud Mansuripur, Yung Chieh Hsieh

Research output: Contribution to journalArticle

Abstract

A simple technique of measuring vertical birefringence over the entire surface of an optical disk substrate was presented. The design involves a linearly polarized He-Ne laser and a CCD camera interfaced to a computer. The measurement is basically non-intrusive, easy to set up, and requires only a few seconds to gather the data and plot a map of vertical birefringence over the surface area of the disk. The system present is potentially advantageous as quality-control instrument in substrate manufacturing environments.

Original languageEnglish (US)
Pages (from-to)8112-8114
Number of pages3
JournalApplied Optics
Volume33
Issue number34
StatePublished - Dec 1 1994

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optical disks
Birefringence
birefringence
Substrates
CCD cameras
quality control
Quality control
manufacturing
plots
Lasers
lasers

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Novel method for measuring the vertical birefringence of optical disk substrates. / Mansuripur, Masud; Hsieh, Yung Chieh.

In: Applied Optics, Vol. 33, No. 34, 01.12.1994, p. 8112-8114.

Research output: Contribution to journalArticle

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