Novel method for precise focal length measurement

Brian J. DeBoo, Jose M Sasian

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Abstract

A new technique for precise focal length measurements by use of a hologram is presented. The hologram is used in first order diffraction to emulate the reflective properties of a convex spherical mirror when performing null tests with a phase-shifting interferometer. The hologram, comprised of concentric reflective rings (much like a Fresnel zone plate), is written lithographically and offers a higher degree of precision, at lower cost, than its spherical mirror counterpart and many other potential measurement techniques.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsP.K. Manhart, J.M. Sasian
Pages114-121
Number of pages8
Volume4832
DOIs
StatePublished - 2002
EventInternational Optical Design Conference 2002 - Tucson, AZ, United States
Duration: Jun 3 2002Jun 5 2002

Other

OtherInternational Optical Design Conference 2002
CountryUnited States
CityTucson, AZ
Period6/3/026/5/02

Fingerprint

Holograms
mirrors
Mirrors
interferometers
Interferometers
rings
Diffraction
diffraction
Costs

Keywords

  • Diffractive optics
  • Focal length
  • Hologram
  • Optical testing

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

DeBoo, B. J., & Sasian, J. M. (2002). Novel method for precise focal length measurement. In P. K. Manhart, & J. M. Sasian (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 4832, pp. 114-121) https://doi.org/10.1117/12.486480

Novel method for precise focal length measurement. / DeBoo, Brian J.; Sasian, Jose M.

Proceedings of SPIE - The International Society for Optical Engineering. ed. / P.K. Manhart; J.M. Sasian. Vol. 4832 2002. p. 114-121.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

DeBoo, BJ & Sasian, JM 2002, Novel method for precise focal length measurement. in PK Manhart & JM Sasian (eds), Proceedings of SPIE - The International Society for Optical Engineering. vol. 4832, pp. 114-121, International Optical Design Conference 2002, Tucson, AZ, United States, 6/3/02. https://doi.org/10.1117/12.486480
DeBoo BJ, Sasian JM. Novel method for precise focal length measurement. In Manhart PK, Sasian JM, editors, Proceedings of SPIE - The International Society for Optical Engineering. Vol. 4832. 2002. p. 114-121 https://doi.org/10.1117/12.486480
DeBoo, Brian J. ; Sasian, Jose M. / Novel method for precise focal length measurement. Proceedings of SPIE - The International Society for Optical Engineering. editor / P.K. Manhart ; J.M. Sasian. Vol. 4832 2002. pp. 114-121
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