Novel method for precise focal length measurement

Brian J. DeBoo, Jose M Sasian

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Scopus citations

Abstract

A new technique for precise focal length measurements by use of a hologram is presented. The hologram is used in first order diffraction to emulate the reflective properties of a convex spherical mirror when performing null tests with a phase-shifting interferometer. The hologram, comprised of concentric reflective rings (much like a Fresnel zone plate), is written lithographically and offers a higher degree of precision, at lower cost, than its spherical mirror counterpart and many other potential measurement techniques.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsP.K. Manhart, J.M. Sasian
Pages114-121
Number of pages8
Volume4832
DOIs
Publication statusPublished - 2002
EventInternational Optical Design Conference 2002 - Tucson, AZ, United States
Duration: Jun 3 2002Jun 5 2002

Other

OtherInternational Optical Design Conference 2002
CountryUnited States
CityTucson, AZ
Period6/3/026/5/02

    Fingerprint

Keywords

  • Diffractive optics
  • Focal length
  • Hologram
  • Optical testing

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

DeBoo, B. J., & Sasian, J. M. (2002). Novel method for precise focal length measurement. In P. K. Manhart, & J. M. Sasian (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 4832, pp. 114-121) https://doi.org/10.1117/12.486480