Novel method for precise focal length measurement

Brian J. DeBoo, Jose M. Sasian

Research output: Contribution to journalConference article

6 Scopus citations

Abstract

A new technique for precise focal length measurements by use of a hologram is presented. The hologram is used in first order diffraction to emulate the reflective properties of a convex spherical mirror when performing null tests with a phase-shifting interferometer. The hologram, comprised of concentric reflective rings (much like a Fresnel zone plate), is written lithographically and offers a higher degree of precision, at lower cost, than its spherical mirror counterpart and many other potential measurement techniques.

Original languageEnglish (US)
Pages (from-to)114-121
Number of pages8
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume4832
DOIs
StatePublished - Dec 1 2002
EventInternational Optical Design Conference 2002 - Tucson, AZ, United States
Duration: Jun 3 2002Jun 5 2002

Keywords

  • Diffractive optics
  • Focal length
  • Hologram
  • Optical testing

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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