Numerical comparison of grid pattern diffraction effects through measurement and modeling with OptiScan software

Ian B. Murray, Victor Densmore, Vaibhav Bora, Matthew W. Pieratt, Douglas L. Hibbard, Thomas D Milster

Research output: Chapter in Book/Report/Conference proceedingConference contribution

10 Citations (Scopus)

Abstract

Coatings of various metalized patterns are used for heating and electromagnetic interference (EMI) shielding applications. Previous work has focused on macro differences between different types of grids, and has shown good correlation between measurements and analyses of grid diffraction. To advance this work, we have utilized the University of Arizona's OptiScan software, which has been optimized for this application by using the Babinet Principle. When operating on an appropriate computer system, this algorithm produces results hundreds of times faster than standard Fourier-based methods, and allows realistic cases to be modeled for the first time. By using previously published derivations by Exotic Electro-Optics, we compare diffraction performance of repeating and randomized grid patterns with equivalent sheet resistance using numerical performance metrics. Grid patterns of each type are printed on optical substrates and measured energy is compared against modeled energy.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Volume8016
DOIs
StatePublished - 2011
EventWindow and Dome Technologies and Materials XII - Orlando, FL, United States
Duration: Apr 27 2011Apr 28 2011

Other

OtherWindow and Dome Technologies and Materials XII
CountryUnited States
CityOrlando, FL
Period4/27/114/28/11

Fingerprint

Numerical Comparisons
Diffraction patterns
Diffraction
diffraction patterns
grids
Grid
computer programs
Software
Sheet resistance
Signal interference
Electrooptical effects
Modeling
Shielding
Macros
Computer systems
Heating
Coatings
Electro-optics
electromagnetic interference
Substrates

Keywords

  • Babinet
  • diffraction
  • grid
  • hub and spoke
  • mesh
  • OptiScan
  • sheet resistance
  • shielding effectiveness

ASJC Scopus subject areas

  • Applied Mathematics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Murray, I. B., Densmore, V., Bora, V., Pieratt, M. W., Hibbard, D. L., & Milster, T. D. (2011). Numerical comparison of grid pattern diffraction effects through measurement and modeling with OptiScan software. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 8016). [80160U] https://doi.org/10.1117/12.883422

Numerical comparison of grid pattern diffraction effects through measurement and modeling with OptiScan software. / Murray, Ian B.; Densmore, Victor; Bora, Vaibhav; Pieratt, Matthew W.; Hibbard, Douglas L.; Milster, Thomas D.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 8016 2011. 80160U.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Murray, IB, Densmore, V, Bora, V, Pieratt, MW, Hibbard, DL & Milster, TD 2011, Numerical comparison of grid pattern diffraction effects through measurement and modeling with OptiScan software. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 8016, 80160U, Window and Dome Technologies and Materials XII, Orlando, FL, United States, 4/27/11. https://doi.org/10.1117/12.883422
Murray IB, Densmore V, Bora V, Pieratt MW, Hibbard DL, Milster TD. Numerical comparison of grid pattern diffraction effects through measurement and modeling with OptiScan software. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 8016. 2011. 80160U https://doi.org/10.1117/12.883422
Murray, Ian B. ; Densmore, Victor ; Bora, Vaibhav ; Pieratt, Matthew W. ; Hibbard, Douglas L. ; Milster, Thomas D. / Numerical comparison of grid pattern diffraction effects through measurement and modeling with OptiScan software. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 8016 2011.
@inproceedings{64a4bda2c8ca44f2bbb137ed51668ea8,
title = "Numerical comparison of grid pattern diffraction effects through measurement and modeling with OptiScan software",
abstract = "Coatings of various metalized patterns are used for heating and electromagnetic interference (EMI) shielding applications. Previous work has focused on macro differences between different types of grids, and has shown good correlation between measurements and analyses of grid diffraction. To advance this work, we have utilized the University of Arizona's OptiScan software, which has been optimized for this application by using the Babinet Principle. When operating on an appropriate computer system, this algorithm produces results hundreds of times faster than standard Fourier-based methods, and allows realistic cases to be modeled for the first time. By using previously published derivations by Exotic Electro-Optics, we compare diffraction performance of repeating and randomized grid patterns with equivalent sheet resistance using numerical performance metrics. Grid patterns of each type are printed on optical substrates and measured energy is compared against modeled energy.",
keywords = "Babinet, diffraction, grid, hub and spoke, mesh, OptiScan, sheet resistance, shielding effectiveness",
author = "Murray, {Ian B.} and Victor Densmore and Vaibhav Bora and Pieratt, {Matthew W.} and Hibbard, {Douglas L.} and Milster, {Thomas D}",
year = "2011",
doi = "10.1117/12.883422",
language = "English (US)",
isbn = "9780819485908",
volume = "8016",
booktitle = "Proceedings of SPIE - The International Society for Optical Engineering",

}

TY - GEN

T1 - Numerical comparison of grid pattern diffraction effects through measurement and modeling with OptiScan software

AU - Murray, Ian B.

AU - Densmore, Victor

AU - Bora, Vaibhav

AU - Pieratt, Matthew W.

AU - Hibbard, Douglas L.

AU - Milster, Thomas D

PY - 2011

Y1 - 2011

N2 - Coatings of various metalized patterns are used for heating and electromagnetic interference (EMI) shielding applications. Previous work has focused on macro differences between different types of grids, and has shown good correlation between measurements and analyses of grid diffraction. To advance this work, we have utilized the University of Arizona's OptiScan software, which has been optimized for this application by using the Babinet Principle. When operating on an appropriate computer system, this algorithm produces results hundreds of times faster than standard Fourier-based methods, and allows realistic cases to be modeled for the first time. By using previously published derivations by Exotic Electro-Optics, we compare diffraction performance of repeating and randomized grid patterns with equivalent sheet resistance using numerical performance metrics. Grid patterns of each type are printed on optical substrates and measured energy is compared against modeled energy.

AB - Coatings of various metalized patterns are used for heating and electromagnetic interference (EMI) shielding applications. Previous work has focused on macro differences between different types of grids, and has shown good correlation between measurements and analyses of grid diffraction. To advance this work, we have utilized the University of Arizona's OptiScan software, which has been optimized for this application by using the Babinet Principle. When operating on an appropriate computer system, this algorithm produces results hundreds of times faster than standard Fourier-based methods, and allows realistic cases to be modeled for the first time. By using previously published derivations by Exotic Electro-Optics, we compare diffraction performance of repeating and randomized grid patterns with equivalent sheet resistance using numerical performance metrics. Grid patterns of each type are printed on optical substrates and measured energy is compared against modeled energy.

KW - Babinet

KW - diffraction

KW - grid

KW - hub and spoke

KW - mesh

KW - OptiScan

KW - sheet resistance

KW - shielding effectiveness

UR - http://www.scopus.com/inward/record.url?scp=79959838046&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=79959838046&partnerID=8YFLogxK

U2 - 10.1117/12.883422

DO - 10.1117/12.883422

M3 - Conference contribution

SN - 9780819485908

VL - 8016

BT - Proceedings of SPIE - The International Society for Optical Engineering

ER -