Observing grain boundaries in monolayer molybdenum disulphide by multiphoton microscopy

Lasse Karvonen, Antti Säynätjoki, Babak Amirsolaimani, Shisheng Li, Soroush Mehravar, Nasser N Peyghambarian, Harri Lipsanen, Goki Eda, Khanh Q Kieu, Zhipei Sun

Research output: Chapter in Book/Report/Conference proceedingConference contribution


Multiphoton microscopy is used to characterize the crystal orientations and grain boundaries of chemical vapor deposited monolayer molybdenum disulphide flakes. Third-harmonic generation is shown to be sensitive for grain boundaries regardless of the crystal mis-orientations.

Original languageEnglish (US)
Title of host publicationNonlinear Optics, NLO 2015
PublisherOptical Society of America (OSA)
ISBN (Print)9781557520012
StatePublished - 2015
EventNonlinear Optics, NLO 2015 - Kauai, United States
Duration: Jul 26 2015Jul 31 2015


OtherNonlinear Optics, NLO 2015
CountryUnited States

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics

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