Off-axis polarizing properties of polarizing beamsplitter cubes

Joseph L. Pezzaniti, Russell A. Chipman

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The field of view dependence of polarizing beam splitter cubes has been studied to characterize their behavior in imaging systems, such as optical computers, optical correlators, and other applications which involve non-collimated light. Significant polarization aberration is present in polarizing beam splitter cubes for two reasons, (1) the s and p orientations at the beamsplitting interface, which define the polarizing axes, vary with direction of propagation; and (2) the coating performance is a function of angle of incidence. Here we present measurements made on several polarizing beam splitter cubes from various vendors. The measurements show typical polarization behavior which is of concern when the cubes are used in imaging systems. A near infra-red imaging polarimeter is used to measure the cubes.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherPubl by Int Soc for Optical Engineering
Pages343-357
Number of pages15
ISBN (Print)0819409197
StatePublished - Dec 1 1992
Externally publishedYes
EventPolarization Analysis and Measurement - San Diego, CA, USA
Duration: Jul 19 1992Jul 21 1992

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume1746
ISSN (Print)0277-786X

Other

OtherPolarization Analysis and Measurement
CitySan Diego, CA, USA
Period7/19/927/21/92

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Pezzaniti, J. L., & Chipman, R. A. (1992). Off-axis polarizing properties of polarizing beamsplitter cubes. In Proceedings of SPIE - The International Society for Optical Engineering (pp. 343-357). (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 1746). Publ by Int Soc for Optical Engineering.