On-machine metrology for aspheric optics testing

Christopher W. King, Niall McGee, David Loke, David Riley, Gerry McCavana, Richard Freeman, Roger Morton, David Walker, Sam Wei, Ping Zhou

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish (US)
Title of host publicationProceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010
Pages33-38
Number of pages6
Volume49
StatePublished - 2010
EventASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010 - Asheville, NC, United States
Duration: Jun 23 2010Jun 25 2010

Other

OtherASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010
CountryUnited States
CityAsheville, NC
Period6/23/106/25/10

Fingerprint

Optics
Testing

ASJC Scopus subject areas

  • Engineering (miscellaneous)

Cite this

King, C. W., McGee, N., Loke, D., Riley, D., McCavana, G., Freeman, R., ... Zhou, P. (2010). On-machine metrology for aspheric optics testing. In Proceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010 (Vol. 49, pp. 33-38)

On-machine metrology for aspheric optics testing. / King, Christopher W.; McGee, Niall; Loke, David; Riley, David; McCavana, Gerry; Freeman, Richard; Morton, Roger; Walker, David; Wei, Sam; Zhou, Ping.

Proceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010. Vol. 49 2010. p. 33-38.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

King, CW, McGee, N, Loke, D, Riley, D, McCavana, G, Freeman, R, Morton, R, Walker, D, Wei, S & Zhou, P 2010, On-machine metrology for aspheric optics testing. in Proceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010. vol. 49, pp. 33-38, ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010, Asheville, NC, United States, 6/23/10.
King CW, McGee N, Loke D, Riley D, McCavana G, Freeman R et al. On-machine metrology for aspheric optics testing. In Proceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010. Vol. 49. 2010. p. 33-38
King, Christopher W. ; McGee, Niall ; Loke, David ; Riley, David ; McCavana, Gerry ; Freeman, Richard ; Morton, Roger ; Walker, David ; Wei, Sam ; Zhou, Ping. / On-machine metrology for aspheric optics testing. Proceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010. Vol. 49 2010. pp. 33-38
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