On observation of dispersion in tunable second-order nonlinearities of silicon-rich nitride thin films

Hung Hsi Lin, Rajat Sharma, Alex Friedman, Benjamin M. Cromey, Felipe Vallini, Matthew W. Puckett, Khanh Kieu, Yeshaiahu Fainman

Research output: Contribution to journalArticlepeer-review

Abstract

We present experimental results on second-harmonic generation in non-stoichiometric, silicon-rich nitride (SRN) films. The as-deposited film presents a second-order nonlinear coefficient, or χ(2), as high as 8pm/V. This value can be widely tuned using the electric field induced second harmonic effect (EFISH), and a maximum value of 22.7pm/V was achieved with this technique. We further illustrate that the second-order nonlinear coefficient exhibited by these films can be highly dispersive in nature, and requires further study and analysis to evaluate their viability for in-waveguide applications at telecommunication wavelengths.

Original languageEnglish (US)
JournalUnknown Journal
StatePublished - Aug 22 2018

ASJC Scopus subject areas

  • General

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